Sebastian Stach

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	Wszystkie	Od 2020
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Ștefan ȚăluUniversitatea Tehnică din Cluj-Napoca, Direcția pentru Managementul Cercetării, Dezvoltării şiZweryfikowany adres z auto.utcluj.ro
Żaneta Garczyk-MundałaInstitute of Biomedical Engineering | Faculty of Science and Technology | Univeristy of SilesiaZweryfikowany adres z us.edu.pl
Stanisław RoskoszFaculty of Materials Engineering, Silesian University of TechnologyZweryfikowany adres z polsl.pl
Mihai TaluZweryfikowany adres z edu.ucv.ro
Atefeh GhaderiQuantum Technologies Research Center (QTRC), Science and Research Branch, Islamic Azad UniversityZweryfikowany adres z alzahra.ac.ir
Shahram SolaymaniHead of Quantum Technologies Research Center, Science and Research Branch, Islamic Azad UniversityZweryfikowany adres z srbiau.ac.ir
Seyed Mohammad ElahiProfessor of physics, science and research Branch, Islamic Azad UniversityZweryfikowany adres z srbiau.ac.ir
Wiktoria SapotaBiomedical Engineering and Materials Science and Engineering, University of SilesiaZweryfikowany adres z us.edu.pl
Zygmunt WróbelUniveristy of SilesiaZweryfikowany adres z us.edu.pl
Dr. Dinesh Pathak Ph. D. PDF (Europe)Univerzita Pardubice, Europe ; Queens University Canada ; University of West Indies; GNDU, IndiaZweryfikowany adres z upce.cz
Joanna MaszybrockaUniversity of Silesia in Katowice, Institute of Materials ScienceZweryfikowany adres z us.edu.pl
Carlos Luna CriadoUniversidad Autónoma de Nuevo León (UANL), Facultad de Ciencias Físico Matemáticas (FCFM), CICFiMZweryfikowany adres z uanl.edu.mx
Nader GhobadiPhysics Department, Faculty of Science, Malayer University, Malayer, IranZweryfikowany adres z malayeru.ac.ir
Rostam Moradianprofessor of physics, Razi University, Kermanshah, IranZweryfikowany adres z razi.ac.ir
Negin Beryani NezafatPostdoc, University of Duisburg-EssenZweryfikowany adres z uni-due.de
Asja ČelebićStomatološki fakultet Sveučilišta u ZagrebuZweryfikowany adres z sfzg.hr
Aman MahajanProfessor in Physics, Guru Nanak Dev University, AmritsarZweryfikowany adres z gndu.ac.in
Dr. Anshul Kumar SharmaDepartment of Higher Education, Govt. of Himachal Pradesh/Guru Nanak Dev University, AmritsarZweryfikowany adres z gndu.ac.in
Grzegorz DerczInstitute of Materials Engineering, Faculty of Science and Technology, University of SilesiaZweryfikowany adres z us.edu.pl
Denitsa ElenkovaСофийски УниверситетZweryfikowany adres z chem.uni-sofia.bg

Obserwuj

Sebastian Stach

University of Silesia in Katowice, Faculty of Science and Technology, Institute of Biomedical Engine

Zweryfikowany adres z us.edu.pl - Strona główna

biomedical engineering fracture surface multifractal analysis confocal microscopy


Tytuł Sortuj wg cytatów Sortuj wg roku Sortuj wg tytułu	Cytowane przez Cytowane przez	Rok
AFM imaging and fractal analysis of surface roughness of AlN epilayers on sapphire substrates D Dallaeva, Ş Ţălu, S Stach, P Škarvada, P Tománek, L Grmela Applied Surface Science 312, 81-86, 2014	114	2014
Usefulness of 3D surface roughness parameters for nondestructive evaluation of pull-off adhesion of concrete layers J Hoła, Ł Sadowski, J Reiner, S Stach Construction and Building Materials 84, 111-120, 2015	107	2015
Characterization of ETL 9357FLA photomultiplier tubes for cryogenic temperature applications A Ankowski, M Antonello, P Aprili, F Arneodo, A Badertscher, ... Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2006	82	2006
Stereometric parameters of the Cu/Fe NPs thin films S Stach, Z Garczyk, S Talu, S Solaymani, A Ghaderi, R Moradian, ... The Journal of Physical Chemistry C 119 (31), 17887-17898, 2015	80	2015
Multifractal description of fracture morphology: theoretical basis S Stach, J Cybo Materials characterization 51 (1), 79-86, 2003	80	2003
Morphological features in aluminum nitride epilayers prepared by magnetron sputtering S Stach, D Dallaeva, Ş Ţălu, P Kaspar, P Tománek, S Giovanzana, ... Materials Science-Poland 33 (1), 175-184, 2015	74	2015
Topographic characterization of Cu–Ni NPs@ aC: H films by AFM and multifractal analysis S Ţălu, S Stach, T Ghodselahi, A Ghaderi, S Solaymani, A Boochani, ... The Journal of Physical Chemistry B 119 (17), 5662-5670, 2015	72	2015
3-D surface stereometry studies of sputtered TiN thin films obtained at different substrate temperatures S Stach, W Sapota, Ş Ţălu, A Ahmadpourian, C Luna, N Ghobadi, ... Journal of Materials Science: Materials in Electronics 28, 2113-2122, 2017	70	2017
Multifractal spectra of atomic force microscope images of Cu/Fe nanoparticles based films thickness Ş Ţălu, S Stach, S Solaymani, R Moradian, A Ghaderi, MR Hantehzadeh, ... Journal of Electroanalytical Chemistry 749, 31-41, 2015	64	2015
Surface morphology of titanium nitride thin films synthesized by DC reactive magnetron sputtering S Talu, S Stach, S Valedbagi, SM Elahi, R Bavadi Mater Sci Poland 33 (1), 137-143, 2015	63	2015
Multifractal characterization of nanostructure surfaces of electrodeposited Ni-P coatings Ş Ţălu, S Stach, A Méndez, G Trejo, M Ţălu Journal of the Electrochemical Society 161 (1), D44, 2013	61	2013
Morphology and optical properties of SiO2-based composite thin films with immobilized terbium (III) complex with a biscoumarin derivative D Elenkova, J Zaharieva, M Getsova, I Manolov, M Milanova, S Stach, ... International Journal of Polymer Analysis and Characterization 20 (1), 42-56, 2015	59	2015
Epitaxy of silicon carbide on silicon: Micromorphological analysis of growth surface evolution R Shikhgasan, Ţ Ştefan, S Dinara, S Sebastian, R Guseyn Superlattices and Microstructures 86, 395-402, 2015	58	2015
Surface roughness characterization of poly (methylmethacrylate) films with immobilized Eu (III) β-Diketonates by fractal analysis Ş Ţălu, S Stach, J Zaharieva, M Milanova, D Todorovsky, S Giovanzana International Journal of Polymer Analysis and Characterization 19 (5), 404-421, 2014	58	2014
Film thickness effect on fractality of tin-doped In₂O₃ thin films Ş Ţălu, S Stach, D Raoufi, F Hosseinpanahi Electronic Materials Letters 11, 749-757, 2015	57	2015
Multifractal characteristics of titanium nitride thin films S Talu, S Stach, S Valedbagi, R Bavadi, SM Elahi, M Talu Mater. Sci. Pol 33 (3), 541-548, 2015	57	2015
Multifractal characterization of water soluble copper phthalocyanine based films surfaces Ş Ţălu, S Stach, A Mahajan, D Pathak, T Wagner, A Kumar, RK Bedi, ... Electronic Materials Letters 10, 719-730, 2014	57	2014
Correlation between surface topography, optical band gaps and crystalline properties of engineered AZO and CAZO thin films L Dejam, S Solaymani, A Achour, S Stach, Ş Ţălu, NB Nezafat, V Dalouji, ... Chemical Physics Letters 719, 78-90, 2019	56	2019
Multifractal analysis of drop‐casted copper (II) tetrasulfophthalocyanine film surfaces on the indium tin oxide substrates Ş Ţălu, S Stach, A Mahajan, D Pathak, T Wagner, A Kumar, RK Bedi Surface and Interface Analysis 46 (6), 393-398, 2014	56	2014
Multifractal characterization of single wall carbon nanotube thin films surface upon exposure to optical parametric oscillator laser irradiation Ş Ţălu, Z Marković, S Stach, BT Marković, M Ţălu Applied Surface Science 289, 97-106, 2014	56	2014

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