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Dr. Oliver Häberlen, Infineon Fellow
Dr. Oliver Häberlen, Infineon Fellow
Inne imiona/nazwiskaOliver Häberlen, Oliver D. Häberlen, Oliver D. Haeberlen
Zweryfikowany adres z infineon.com
Tytuł
Cytowane przez
Cytowane przez
Rok
GaN-on-Si power technology: Devices and applications
KJ Chen, O Häberlen, A Lidow, C lin Tsai, T Ueda, Y Uemoto, Y Wu
IEEE Transactions on Electron Devices 64 (3), 779-795, 2017
14782017
The 2018 GaN power electronics roadmap
H Amano, Y Baines, E Beam, M Borga, T Bouchet, PR Chalker, M Charles, ...
Journal of Physics D: Applied Physics 51 (16), 163001, 2018
12552018
From clusters to bulk: A relativistic density functional investigation on a series of gold clusters
OD Häberlen, SC Chung, M Stener, N Rösch
The Journal of chemical physics 106 (12), 5189-5201, 1997
4261997
Quenching of magnetic moments by ligand-metal interactions in nanosized magnetic metal clusters
DA van Leeuwen, JM Van Ruitenbeek, LJ De Jongh, A Ceriotti, ...
Physical review letters 73 (10), 1432, 1994
2401994
Threshold voltage instability in p-GaN gate AlGaN/GaN HFETs
L Sayadi, G Iannaccone, S Sicre, O Häberlen, G Curatola
IEEE Transactions on Electron Devices 65 (6), 2454-2460, 2018
2252018
A scalar-relativistic extension of the linear combination of Gaussian-type orbitals local density functional method: application to AuH, AuCl and Au2
OD Häberlen, N Rösch
Chemical physics letters 199 (5), 491-496, 1992
2181992
Stability of main-group element-centered gold cluster cations
OD Haeberlen, H Schmidbaur, N Roesch
Journal of the American Chemical Society 116 (18), 8241-8248, 1994
1441994
Effect of phosphine substituents in gold (I) complexes: a theoretical study of MeAuPR3, R= H, Me, Ph
OD Haeberlen, N Roesch
The Journal of Physical Chemistry 97 (19), 4970-4973, 1993
1251993
Influence of buffer carbon doping on pulse and AC behavior of insulated-gate field-plated power AlGaN/GaN HEMTs
G Verzellesi, L Morassi, G Meneghesso, M Meneghini, E Zanoni, ...
IEEE Electron Device Letters 35 (4), 443-445, 2014
1192014
C. l. Tsai, T. Ueda, Y. Uemoto, and Y. Wu,“GaN-on-Si power technology: Devices and applications,”
KJ Chen, O Häberlen, A Lidow
IEEE Transactions on Electron Devices 64 (3), 779-795, 2017
1152017
On the Origin of the -Losses in Soft-Switching GaN-on-Si Power HEMTs
M Guacci, M Heller, D Neumayr, D Bortis, JW Kolar, G Deboy, ...
IEEE Journal of Emerging and Selected Topics in Power Electronics 7 (2), 679-694, 2018
1112018
Relevance of relativistic exchange-correlation functionals and of finite nuclei in molecular density-functional calculations
M Mayer, OD Häberlen, N Rösch
Physical Review A 54 (6), 4775, 1996
1021996
Method for manufacturing a semiconductor component
G Deboy, W Friza, O Häberlen, M Rüb, H Strack
US Patent 6,649,459, 2003
942003
Semiconductor device
O Haeberlen, J Krumrey, F Hirler, W Rieger
US Patent 8,022,474, 2011
812011
Degradation mechanisms of GaN HEMTs with p-type gate under forward gate bias overstress
M Ruzzarin, M Meneghini, A Barbato, V Padovan, O Haeberlen, ...
IEEE Transactions on Electron Devices 65 (7), 2778-2783, 2018
772018
Perspective of loss mechanisms for silicon and wide band-gap power devices
G Deboy, O Haeberlen, M Treu
CPSS Transactions on Power electronics and applications 2 (2), 89-100, 2017
762017
Asymmetric localization of titanium in carbon molecule (C28)
BI Dunlap, OD Haeberlen, N Roesch
The Journal of Physical Chemistry 96 (23), 9095-9097, 1992
741992
Relativistic density‐functional studies of naked and ligated gold clusters
OD Häberlen, SC Chung, N Rösch, N Rösch
International Journal of Quantum Chemistry 52 (S28), 595-610, 1994
711994
Si, SiC and GaN power devices: An unbiased view on key performance indicators
G Deboy, M Treu, O Häberlen, D Neumayr
2016 IEEE International Electron Devices Meeting (IEDM), 20.2. 1-20.2. 4, 2016
692016
Application specific trade-offs for WBG SiC, GaN and high end Si power switch technologies
R Rupp, T Laska, O Häberlen, M Treu
2014 IEEE International Electron Devices Meeting, 2.3. 1-2.3. 4, 2014
652014
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