| Device Simulation Study of the SEU Sensitivity of SRAMs to Internal Ion Tracks Generated by Nuclear Reactions MCCSF J. M. Palau, G. Hubert, K. Coulié, B. Sagnes IEEE Transactions on Nuclear Sciences 48 (2), 225-231, 2001 | 142 | 2001 |
| Criterion for SEU occurrence in SRAM deduced from circuit and device simulations in case of neutron-induced SER T Merelle, H Chabane, JM Palau, K Castellani-Coulie, F Wrobel, F Saigné, ... IEEE transactions on nuclear science 52 (4), 1148-1155, 2005 | 84 | 2005 |
| Detailed analysis of secondary ions' effect for the calculation of neutron-induced SER in SRAMs G Hubert, JM Palau, K Castellani-Coulie, MC Calvet, S Fourtine IEEE Transactions on Nuclear Science 48 (6), 1953-1959, 2001 | 77 | 2001 |
| Various SEU conditions in SRAM studied by 3-D device simulation K Castellani-Coulié, JM Palau, G Hubert, MC Calvet, PE Dodd, F Sexton IEEE Transactions on Nuclear Science 48 (6), 1931-1936, 2001 | 61 | 2001 |
| Monte Carlo exploration of neutron-induced SEU-sensitive volumes in SRAMs JM Palau, R Wrobel, K Castellani-Coulié, MC Calvet, PE Dodd, ... IEEE Transactions on Nuclear Science 49 (6), 3075-3081, 2002 | 52 | 2002 |
| Simulation analysis of the bipolar amplification in fully-depleted SOI technologies under heavy-ion irradiations K Castellani-Coulié, D Munteanu, V Ferlet-Cavrois, JL Autran IEEE transactions on nuclear science 52 (5), 1474-1479, 2005 | 51 | 2005 |
| Altitude SEE test European platform (ASTEP) and first results in CMOS 130 nm SRAM JL Autran, P Roche, J Borel, C Sudre, K Castellani-Coulié, D Munteanu, ... IEEE Transactions on Nuclear Science 54 (4), 1002-1009, 2007 | 39 | 2007 |
| Simulation of single and multi-node collection: Impact on SEU occurrence in nanometric SRAM cells G Toure, G Hubert, K Castellani-Coulie, S Duzellier, JM Portal IEEE Transactions on Nuclear Science 58 (3), 862-869, 2011 | 34 | 2011 |
| Investigation of 30 nm gate-all-around MOSFET sensitivity to heavy ions: A 3-D simulation study K Castellani-Coulie, D Munteanu, JL Autran, V Ferlet-Cavrois, P Paillet, ... IEEE transactions on nuclear science 53 (4), 1950-1958, 2006 | 29 | 2006 |
| Development of a CMOS oscillator concept for particle detection and tracking K Castellani-Coulié, H Aziza, W Rahajandraibe, G Micolau, JM Portal IEEE Transactions on Nuclear Science 60 (4), 2450-2455, 2013 | 23 | 2013 |
| Analysis of 45-nm multi-gate transistors behavior under heavy ion irradiation by 3-D device simulation K Castellani-Couli, D Munteanu, JL Autran, V Ferlet-Cavrois, P Paillet, ... IEEE transactions on nuclear science 53 (6), 3265-3270, 2006 | 22 | 2006 |
| Qualification methodology for sub-micron ICs at the low noise underground laboratory of rustrel A Lesea, K Castellani-Coulie, G Waysand, J Le Mauff, C Sudre IEEE Transactions on Nuclear Science 55 (4), 2148-2153, 2008 | 21 | 2008 |
| Simulation analysis of the bipolar amplification induced by heavy-ion irradiation in double-gate MOSFETs K Castellani-Coulie, D Munteanu, JL Autran, V Ferlet-Cavrois, P Paillet, ... IEEE transactions on nuclear science 52 (6), 2137-2143, 2005 | 21 | 2005 |
| Optimization using Monte Carlo calculations of a Bonner sphere spectrometer extended to high energies for the neutron environments characterization S Serre, K Castellani-Coulié, D Paul, V Lacoste IEEE Transactions on Nuclear Science 56 (6), 3582-3590, 2009 | 18 | 2009 |
| Comparison of NMOS and PMOS transistor sensitivity to SEU in SRAMs by device simulation K Castellani-Coulie, B Sagnes, F Saigne, JM Palau, MC Calvet, PE Dodd, ... IEEE Transactions on Nuclear Science 50 (6), 2239-2244, 2003 | 15 | 2003 |
| Circuit effect on collection mechanisms involved in single event phenomena: Application to the response of a NMOS transistor in a 90 nm SRAM cell K Castellani-Coulie, G Toure, JM Portal, O Ginez, H Aziza, A Lesea IEEE Transactions on Nuclear Science 58 (3), 870-876, 2011 | 13 | 2011 |
| Study of an SOI SRAM sensitivity to SEU by 3-D device simulation K Castellani-Coulie, B Sagnes, F Saigne, JM Palau, MC Calvet, PE Dodd, ... IEEE Transactions on Nuclear Science 51 (5), 2799-2804, 2004 | 13 | 2004 |
| Experimental study and analysis of soft errors in 90nm Xilinx FPGA and beyond A Lesea, K Castellani-Coulie Radiation and Its Effects on Components and Systems, 2007. RADECS 2007. 9th …, 2007 | 10 | 2007 |
| Performance degradation induced by fringing field-induced barrier lowering and parasitic charge in double-gate metal–oxide–semiconductor field-effect transistors with high-κ … JL Autran, D Munteanu, M Houssa, K Castellani-Coulié, A Said Japanese journal of applied physics 44 (12R), 8362, 2005 | 9 | 2005 |
| Improvement of a detection chain based on a VCO concept for microelectronic reliability under natural radiative environment K Coulie-Castellani, W Rahajandraibe, H Aziza, JM Portal, G Micolau Test Symposium (LATS), 2015 16th Latin-American, 1-5, 2015 | 8 | 2015 |
