| Spontaneous and induced atomic decay in photonic band structures AG Kofman, G Kurizki, B Sherman Journal of Modern Optics 41 (2), 353-384, 1994 | 354 | 1994 |
| Generation and detection of nonclassical field states by conditional measurements following two-photon resonant interactions BM Garraway, B Sherman, H Moya-Cessa, PL Knight, G Kurizki Physical Review A 49 (1), 535, 1994 | 214 | 1994 |
| A holistic metrology approach: hybrid metrology utilizing scatterometry, CD-AFM, and CD-SEM A Vaid, BB Yan, YT Jiang, M Kelling, C Hartig, J Allgair, P Ebersbach, ... Metrology, Inspection, and Process Control for Microlithography XXV 7971, 21-40, 2011 | 80 | 2011 |
| Preparation and detection of macroscopic quantum superpositions by two-photon field-atom interactions B Sherman, G Kurizki Physical Review A 45 (11), R7674, 1992 | 77 | 1992 |
| Universal classical mechanism of free-electron lasing without inversion B Sherman, G Kurizki, DE Nikonov, MO Scully Physical review letters 75 (25), 4602, 1995 | 61 | 1995 |
| Quantum-state control by a single conditional measurement: The periodically switched Jaynes-Cummings model A Kozhekin, G Kurizki, B Sherman Physical Review A 54 (4), 3535, 1996 | 47 | 1996 |
| Lasing without inversion in Cherenkov free-electron lasers DE Nikonov, B Sherman, G Kurizki, MO Scully Optics communications 123 (1-3), 363-371, 1996 | 42 | 1996 |
| Nonclassical field dynamics in photonic band structures: Atomic-beam resonant interaction with a spatially periodic field mode B Sherman, G Kurizki, A Kadyshevitch Physical review letters 69 (13), 1927, 1992 | 39 | 1992 |
| Enhanced squeezing by periodic frequency modulation under parametric instability conditions I Averbukh, B Sherman, G Kurizki Physical Review A 50 (6), 5301, 1994 | 37 | 1994 |
| Quantum electrodynamics in photonic band gaps: atomic-beam interaction with a defect mode G Kurizki, B Sherman, A Kadyshevitch Journal of the Optical Society of America B 10 (2), 346-352, 1993 | 29 | 1993 |
| Holistic metrology approach: hybrid metrology utilizing scatterometry, critical dimension-atomic force microscope and critical dimension-scanning electron microscope A Vaid, BB Yan, YT Jiang, M Kelling, C Hartig, J Allgair, P Ebersbach, ... Journal of Micro/Nanolithography, MEMS and MOEMS 10 (4), 043016-043016-13, 2011 | 26 | 2011 |
| Apparatus and method for defect detection including patch-to-patch comparisons M Dalla-Torre, B Sherman, Z Hadad, YU Danino, N Bullkich US Patent 9,367,911, 2016 | 16 | 2016 |
| PREPARATION OF NONCLASSICAL FIELD STATES BY RESONANCE FLUORESCENCE IN PHOTONIC BAND STRUCTURES B Sherman, AG Kofman, G Kurizki Applied Physics B-Lasers And Optics 60 (3-Feb), S99-S105, 1995 | 10 | 1995 |
| Method and system for measuring in patterned structures B Brill, B Sherman US Patent App. 13/581,393, 2013 | 7 | 2013 |
| Method and system for use in measuring in complex patterned structures B Brill, B Sherman US Patent App. 13/978,066, 2013 | 6 | 2013 |
| A holistic metrology approach: multi-channel scatterometry for complex applications C Bozdog, HK Kim, S Emans, B Sherman, I Turovets, R Urensky, B Brill, ... Metrology, Inspection, and Process Control for Microlithography XXV 7971 …, 2011 | 5 | 2011 |
| Automatic defect classification using topography map from SEM photometric stereo SD Serulnik, J Cohen, B Sherman, A Ben-Porath Data Analysis and Modeling for Process Control 5378, 124-133, 2004 | 4 | 2004 |
| Effects of quantum coherence of electromagnetic radiation in interactions with electrons AD Gazazyan, BG Sherman JETP 69 (1), 38, 1989 | 3 | 1989 |
| Resonance fluorescence of an atom in compressed light AD Gasasyan, BG Sherman Opt. Spectrosc.(USA) 70 (3), 398, 1991 | 2 | 1991 |
| Defect examination on a semiconductor specimen YH Ofir, Y Ridelman, R Badanes, B Sherman, B Cohen US Patent App. 17/903,262, 2024 | 1 | 2024 |