| Lock-in thermography: Basics and use for evaluating electronic devices and materials O Breitenstein, W Warta, MC Schubert Springer, 2019 | 985* | 2019 |
| Shunt types in crystalline silicon solar cells O Breitenstein, JP Rakotoniaina, MH Al Rifai, M Werner Progress in Photovoltaics: Research and Applications 12 (7), 529-538, 2004 | 409 | 2004 |
| Explanation of potential-induced degradation of the shunting type by Na decoration of stacking faults in Si solar cells V Naumann, D Lausch, A Hähnel, J Bauer, O Breitenstein, A Graff, ... Solar Energy Materials and Solar Cells 120, 383-389, 2014 | 390 | 2014 |
| On the detection of shunts in silicon solar cells by photo‐and electroluminescence imaging O Breitenstein, J Bauer, T Trupke, RA Bardos Progress in Photovoltaics: research and Applications 16 (4), 325-330, 2008 | 183 | 2008 |
| Understanding junction breakdown in multicrystalline solar cells O Breitenstein, J Bauer, K Bothe, W Kwapil, D Lausch, U Rau, J Schmidt, ... Journal of Applied Physics 109 (7), 2011 | 171 | 2011 |
| Shunts due to laser scribing of solar cells evaluated by highly sensitive lock-in thermography O Breitenstein, M Langenkamp, O Lang, A Schirrmacher Solar Energy Materials and Solar Cells 65 (1-4), 55-62, 2001 | 167 | 2001 |
| Quantitative evaluation of shunts in solar cells by lock‐in thermography O Breitenstein, JP Rakotoniaina, MHA Rifai Progress in Photovoltaics: Research and Applications 11 (8), 515-526, 2003 | 162 | 2003 |
| On the mechanism of potential‐induced degradation in crystalline silicon solar cells J Bauer, V Naumann, S Großer, C Hagendorf, M Schütze, O Breitenstein physica status solidi (RRL)–Rapid Research Letters 6 (8), 331-333, 2012 | 158 | 2012 |
| Potential-induced degradation (PID): Introduction of a novel test approach and explanation of increased depletion region recombination D Lausch, V Naumann, O Breitenstein, J Bauer, A Graff, J Bagdahn, ... IEEE journal of photovoltaics 4 (3), 834-840, 2014 | 150 | 2014 |
| Explanation of commonly observed shunt currents in c-Si solar cells by means of recombination statistics beyond the Shockley-Read-Hall approximation S Steingrube, O Breitenstein, K Ramspeck, S Glunz, A Schenk, ... Journal of Applied Physics 110 (1), 2011 | 144 | 2011 |
| Nondestructive local analysis of current–voltage characteristics of solar cells by lock-in thermography O Breitenstein Solar Energy Materials and Solar Cells 95 (10), 2933-2936, 2011 | 135 | 2011 |
| Microscopic lock-in thermography investigation of leakage sites in integrated circuits O Breitenstein, M Langenkamp, F Altmann, D Katzer, A Lindner, H Eggers Review of scientific instruments 71 (11), 4155-4160, 2000 | 129 | 2000 |
| The role of stacking faults for the formation of shunts during potential‐induced degradation of crystalline Si solar cells V Naumann, D Lausch, A Graff, M Werner, S Swatek, J Bauer, A Hähnel, ... physica status solidi (RRL)–Rapid Research Letters 7 (5), 315-318, 2013 | 128 | 2013 |
| Quantitative evaluation of electroluminescence images of solar cells O Breitenstein, A Khanna, Y Augarten, J Bauer, JM Wagner, K Iwig physica status solidi (RRL)–Rapid Research Letters 4 (1‐2), 7-9, 2010 | 125 | 2010 |
| Sodium outdiffusion from stacking faults as root cause for the recovery process of potential-induced degradation (PID) D Lausch, V Naumann, A Graff, A Hähnel, O Breitenstein, C Hagendorf, ... Energy Procedia 55, 486-493, 2014 | 112 | 2014 |
| The origin of ideality factors n> 2 of shunts and surfaces in the dark IV curves of Si solar cells O Breitenstein, P Altermatt, K Ramspeck, A Schenk Proceedings of the 21st European photovoltaic solar energy conference, 625-628, 2006 | 112 | 2006 |
| Can luminescence imaging replace lock-in thermography on solar cells? O Breitenstein, J Bauer, K Bothe, D Hinken, J Müller, W Kwapil, ... IEEE Journal of Photovoltaics 1 (2), 159-167, 2011 | 111 | 2011 |
| Hot spots in multicrystalline silicon solar cells: avalanche breakdown due to etch pits J Bauer, JM Wagner, A Lotnyk, H Blumtritt, B Lim, J Schmidt, ... physica status solidi (RRL)–Rapid Research Letters 3 (2‐3), 40-42, 2009 | 111 | 2009 |
| Lock-in IR-thermography-A novel tool for material and device characterization ST Huth, O Breitenstein, A Huber, D Dantz, U Lambert, F Altmann diffusion and defect data part B solid state phenomena, 741-746, 2002 | 107 | 2002 |
| Defect induced non-ideal dark I–V characteristics of solar cells O Breitenstein, J Bauer, A Lotnyk, JM Wagner Superlattices and Microstructures 45 (4-5), 182-189, 2009 | 105 | 2009 |
Jan BauerUniversity of LeipzigVerifisert e-postadresse på uni-leipzig.de
