Joan Marc Rafí

Joan Marc Rafí

Instituto de Microelectrónica de Barcelona, IMB-CNM, CSIC, Científico Titular del CSIC
Verifisert e-postadresse på csic.es
Sitert av 21724
Electrical characterization Electrical Reliability Radiation effects Advanced CMOS devices Semiconductor radiation detectors
Abygael Viey

Abygael Viey

CEA
Sitert av 133
Electrical Reliability Electrical Characterization MOSFET Microelectronics
Amran Mohd Selva

Amran Mohd Selva

Advanced Lightning, Power and Energy Research Centre, UPM
Verifisert e-postadresse på student.upm.edu.my
Sitert av 63
Transformer Diagnosis High Voltage Asset Management Electrical Reliability