| Radiation induced leakage current and stress induced leakage current in ultra-thin gate oxides M Ceschia, A Paccagnella, A Cester, A Scarpa, G Ghidini IEEE Transactions on Nuclear Science 45 (6), 2375-2382, 1998 | 194 | 1998 |
| Trapping phenomena in AlGaN/GaN HEMTs: a study based on pulsed and transient measurements G Meneghesso, M Meneghini, D Bisi, I Rossetto, A Cester, UK Mishra, ... Semiconductor Science and Technology 28 (7), 074021, 2013 | 122 | 2013 |
| High open‐circuit voltage Cs2AgBiBr6 carbon‐based perovskite solar cells via green processing of ultrasonic spray‐coated carbon electrodes from waste tire sources F Schmitz, N Lago, L Fagiolari, J Burkhart, A Cester, A Polo, M Prato, ... ChemSusChem, 2022 | 65 | 2022 |
| Flexible and Organic Neural Interfaces: A Review N Lago, A Cester Applied Sciences 7 (12), 1292, 2017 | 62 | 2017 |
| Thermal stress effects on dye-sensitized solar cells (DSSCs) D Bari, N Wrachien, R Tagliaferro, S Penna, TM Brown, A Reale, ... Microelectronics Reliability 51 (9-11), 1762-1766, 2011 | 53 | 2011 |
| Accelerated wear-out of ultra-thin gate oxides after irradiation A Cester, S Cimino, A Paccagnella, G Ghibaudo, G Ghidini, J Wyss IEEE Transactions on Nuclear Science 50 (3), 729-734, 2003 | 51 | 2003 |
| Drain current decrease in MOSFETs after heavy ion irradiation A Cester, S Gerardin, A Paccagnella, JR Schwank, G Vizkelethy, ... IEEE transactions on nuclear science 51 (6), 3150-3157, 2004 | 50 | 2004 |
| Noise characteristics of radiation-induced soft breakdown current in ultrathin gate oxides A Cester, L Bandiera, M Ceschia, G Ghidini, A Paccagnella IEEE Transactions on Nuclear Science 48 (6), 2093-2100, 2001 | 50 | 2001 |
| Collapse of MOSFET drain current after soft breakdown and its dependence on the transistor aspect ratio W/L A Cester, S Cimino, A Paccagnella, G Ghidini, G Guegan 2003 IEEE International Reliability Physics Symposium Proceedings, 2003 …, 2003 | 42 | 2003 |
| Influence of shunt resistance on the performance of an illuminated string of solar cells: theory, simulation, and experimental analysis M Barbato, M Meneghini, A Cester, G Mura, E Zanoni, G Meneghesso IEEE Transactions on Device and Materials Reliability 14 (4), 942-950, 2014 | 40 | 2014 |
| High-voltage double-pulsed measurement system for GaN-based power HEMTs D Bisi, A Stocco, M Meneghini, F Rampazzo, A Cester, G Meneghesso, ... 2014 IEEE International Reliability Physics Symposium, CD. 11.1-CD. 11.4, 2014 | 36 | 2014 |
| A physical-based equivalent circuit model for an organic/electrolyte interface N Lago, A Cester, N Wrachien, M Natali, SD Quiroga, S Bonetti, ... Organic Electronics 35, 176-185, 2016 | 35 | 2016 |
| Thermal and electrical stress effects of electrical and optical characteristics of Alq3/NPD OLED A Cester, D Bari, J Framarin, N Wrachien, G Meneghesso, S Xia, ... Microelectronics Reliability 50 (9-11), 1866-1870, 2010 | 35 | 2010 |
| Worldwide outdoor round robin study of organic photovoltaic devices and modules MV Madsen, SA Gevorgyan, R Pacios, J Ajuria, I Etxebarria, J Kettle, ... Solar energy materials and solar cells 130, 281-290, 2014 | 34 | 2014 |
| Worldwide Outdoor Round Robin Study of Organic Photovoltaic Devices and Modules Solar Energy Materials and Solar Cells 130, 281-290, 2014 | 34 | 2014 |
| Impact of 24-GeV proton irradiation on 0.13-μm CMOS devices S Gerardin, A Gasperin, A Cester, A Paccagnella, G Ghidini, A Candelori, ... 2005 8th European Conference on Radiation and Its Effects on Components and …, 2005 | 32 | 2005 |
| Collapse of MOSFET drain current after soft breakdown A Cester, A Paccagnella, G Ghidini, S Deleonibus, G Guegan IEEE Transactions on Device and Materials Reliability 4 (1), 63-72, 2004 | 32 | 2004 |
| Understanding lead iodide perovskite hysteresis and degradation causes by extensive electrical characterization A Rizzo, F Lamberti, M Buonomo, N Wrachien, L Torto, N Lago, S Sansoni, ... Solar Energy Materials and Solar Cells 189, 43-52, 2019 | 31 | 2019 |
| Total ionizing dose effects on 4 Mbit phase change memory arrays A Gasperin, N Wrachien, A Paccagnella, F Ottogalli, U Corda, P Fuochi, ... IEEE Transactions on Nuclear Science 55 (4), 2090-2097, 2008 | 29 | 2008 |
| Ionizing radiation effect on ferroelectric nonvolatile memories and its dependence on the irradiation temperature M Zanata, N Wrachien, A Cester IEEE Transactions on Nuclear Science 55 (6), 3237-3245, 2008 | 28 | 2008 |
Gaudenzio MeneghessoUniversity of Padova, Dept. of Information EngineeringGeverifieerd e-mailadres voor dei.unipd.it
