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Juyeon Yoon
Juyeon Yoon
kaist.ac.kr의 이메일 확인됨 - 홈페이지
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Large language models are few-shot testers: Exploring llm-based general bug reproduction
S Kang, J Yoon, S Yoo
2023 IEEE/ACM 45th International Conference on Software Engineering (ICSE …, 2023
1572023
Lora-based visual monitoring scheme for agriculture iot
M Ji, J Yoon, J Choo, M Jang, A Smith
2019 IEEE sensors applications symposium (SAS), 1-6, 2019
882019
Towards autonomous testing agents via conversational large language models
R Feldt, S Kang, J Yoon, S Yoo
2023 38th IEEE/ACM International Conference on Automated Software …, 2023
382023
Searching for multi-fault programs in defects4j
G An, J Yoon, S Yoo
International Symposium on Search Based Software Engineering, 153-158, 2021
182021
Intent-driven mobile gui testing with autonomous large language model agents
J Yoon, R Feldt, S Yoo
2024 IEEE Conference on Software Testing, Verification and Validation (ICST …, 2024
11*2024
The GitHub recent bugs dataset for evaluating LLM-based debugging applications
JY Lee, S Kang, J Yoon, S Yoo
2024 IEEE Conference on Software Testing, Verification and Validation (ICST …, 2024
82024
Evaluating diverse large language models for automatic and general bug reproduction
S Kang, J Yoon, N Askarbekkyzy, S Yoo
IEEE Transactions on Software Engineering, 2024
62024
Automatically identifying shared root causes of test breakages in SAP HANA
G An, J Yoon, J Sohn, J Hong, D Hwang, S Yoo
Proceedings of the 44th International Conference on Software Engineering …, 2022
62022
Repairing fragile gui test cases using word and layout embedding
J Yoon, S Chung, K Shin, J Kim, S Hong, S Yoo
2022 IEEE Conference on Software Testing, Verification and Validation (ICST …, 2022
52022
Dnn model deployment on distributed edges
E Cho, J Yoon, D Baek, D Lee, DH Bae
International Conference on Web Engineering, 15-26, 2021
52021
Just-in-time flaky test detection via abstracted failure symptom matching
G An, J Yoon, T Bach, J Hong, S Yoo
arXiv preprint arXiv:2310.06298, 2023
42023
Enhancing Lexical Representation of Test Coverage for Failure Clustering
J Yoon, S Yoo
2021 36th IEEE/ACM International Conference on Automated Software …, 2021
22021
Improving Test Distance for Failure Clustering with Hypergraph Modelling
G An, J Yoon, JJ Whang, S Yoo
arXiv preprint arXiv:2104.10360, 2021
12021
Preliminary Evaluation of SWAY in Permutation Decision Space via a Novel Euclidean Embedding
J Lee, C Jung, YH Park, D Lee, J Yoon, S Yoo
Search-Based Software Engineering: 13th International Symposium, SSBSE 2021 …, 2021
2021
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학술자료 1–14