| A novel pulsed magnetron sputter technique utilizing very high target power densities V Kouznetsov, K Macak, JM Schneider, U Helmersson, I Petrov Surface and coatings technology 122 (2-3), 290-293, 1999 | 1356 | 1999 |
| Calculated elastic properties of M2AlC (M= Ti, V, Cr, Nb and Ta) Z Sun, S Li, R Ahuja, JM Schneider Solid state communications 129 (9), 589-592, 2004 | 523 | 2004 |
| Ionized sputter deposition using an extremely high plasma density pulsed magnetron discharge K Macák, V Kouznetsov, J Schneider, U Helmersson, I Petrov Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 18 (4 …, 2000 | 368 | 2000 |
| Bonding and classification of nanolayered ternary carbides Z Sun, D Music, R Ahuja, S Li, JM Schneider Physical Review B—Condensed Matter and Materials Physics 70 (9), 092102, 2004 | 293 | 2004 |
| Influence of the Al distribution on the structure, elastic properties, and phase stability of supersaturated Ti1− xAlxN PH Mayrhofer, D Music, JM Schneider Journal of Applied Physics 100 (9), 2006 | 279 | 2006 |
| Theoretical investigation of the bonding and elastic properties of nanolayered ternary nitrides Z Sun, D Music, R Ahuja, JM Schneider Physical Review B—Condensed Matter and Materials Physics 71 (19), 193402, 2005 | 265 | 2005 |
| Thermal stability of Ti3SiC2 thin films J Emmerlich, D Music, P Eklund, O Wilhelmsson, U Jansson, ... Acta Materialia 55 (4), 1479-1488, 2007 | 260 | 2007 |
| Structure and bulk modulus of (M=Ti, V, and Cr) Z Sun, R Ahuja, S Li, JM Schneider Applied Physics Letters 83 (5), 899-901, 2003 | 232 | 2003 |
| Ab initio calculations and experimental determination of the structure of Cr2AlC JM Schneider, Z Sun, R Mertens, F Uestel, R Ahuja Solid State Communications 130 (7), 445-449, 2004 | 228 | 2004 |
| Elemental segregation in an AlCoCrFeNi high-entropy alloy–A comparison between selective laser melting and induction melting D Karlsson, A Marshal, F Johansson, M Schuisky, M Sahlberg, ... Journal of Alloys and Compounds 784, 195-203, 2019 | 186 | 2019 |
| Towards large area deposition of Cr2AlC on steel C Walter, DP Sigumonrong, T El-Raghy, JM Schneider Thin Solid Films 515 (2), 389-393, 2006 | 183 | 2006 |
| Ab initio calculated binodal and spinodal of cubic Ti1− xAlxN PH Mayrhofer, D Music, JM Schneider Applied Physics Letters 88 (7), 2006 | 181 | 2006 |
| Multilayer composite ceramicmetal-DLC coatings for sliding wear applications AA Voevodin, JM Schneider, C Rebholz, A Matthews Tribology international 29 (7), 559-570, 1996 | 176 | 1996 |
| Crystalline alumina deposited at low temperatures by ionized magnetron sputtering JM Schneider, WD Sproul, AA Voevodin, A Matthews Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 15 (3 …, 1997 | 168 | 1997 |
| Intrinsic and extrinsic size effects in the deformation of amorphous CuZr/nanocrystalline Cu nanolaminates W Guo, E Jägle, J Yao, V Maier, S Korte-Kerzel, JM Schneider, D Raabe Acta Materialia 80, 94-106, 2014 | 165 | 2014 |
| Experiment and simulation of the compositional evolution of Ti–B thin films deposited by sputtering of a compound target J Neidhardt, S Mráz, JM Schneider, E Strub, W Bohne, B Liedke, W Möller, ... Journal of applied physics 104 (6), 2008 | 162 | 2008 |
| Influence of the negative oxygen ions on the structure evolution of transition metal oxide thin films S Mraz, JM Schneider Journal of Applied Physics 100 (2), 2006 | 158 | 2006 |
| Recent developments in plasma assisted physical vapour deposition JM Schneider, S Rohde, WD Sproul, A Matthews Journal of Physics D: Applied Physics 33 (18), R173, 2000 | 149 | 2000 |
| Structure, elastic properties and phase stability of Cr1–xAlxN PH Mayrhofer, D Music, T Reeswinkel, HG Fuß, JM Schneider Acta Materialia 56 (11), 2469-2475, 2008 | 144 | 2008 |
| The physical reason for the apparently low deposition rate during high-power pulsed magnetron sputtering J Emmerlich, S Mráz, R Snyders, K Jiang, JM Schneider Vacuum 82 (8), 867-870, 2008 | 142 | 2008 |
Lars Hultman, Professor, PhDLinköping University, Department of Physics, IFMifm.liu.se의 이메일 확인됨
