| Creation of an Atomic Superlattice by Immersing Metallic Adatoms<? format?> in a Two-Dimensional Electron Sea F Silly, M Pivetta, M Ternes, F Patthey, JP Pelz, WD Schneider Physical review letters 92 (1), 016101, 2004 | 273 | 2004 |
| Nanometer-scale test of the Tung model of Schottky-barrier height inhomogeneity HJ Im, Y Ding, JP Pelz, WJ Choyke Physical Review B 64 (7), 075310, 2001 | 166 | 2001 |
| Quantitative "local-interference" model for noise in metal films J Pelz, J Clarke Physical Review B 36 (8), 4479, 1987 | 140 | 1987 |
| Spatially-resolved spectroscopic measurements of Ec− 0.57 eV traps in AlGaN/GaN high electron mobility transistors DW Cardwell, A Sasikumar, AR Arehart, SW Kaun, J Lu, S Keller, ... Applied Physics Letters 102 (19), 2013 | 124 | 2013 |
| Dependence of Noise on Defects Induced in Copper Films by Electron Irradiation J Pelz, J Clarke Physical review letters 55 (7), 738, 1985 | 114 | 1985 |
| Scanning tunneling microscopy study of oxide nucleation and oxidation-induced roughening at elevated temperatures on the Si (001)-(2× 1) surface JV Seiple, JP Pelz Physical review letters 73 (7), 999, 1994 | 101 | 1994 |
| Striped Phase and Temperature Dependent Step Shape Transition on Highly B-Doped Si(001)-( ) Surfaces DE Jones, JP Pelz, Y Hong, E Bauer, IST Tsong Physical review letters 77 (2), 330, 1996 | 92 | 1996 |
| Instrumentation for direct, low frequency scanning capacitance microscopy, and analysis of position dependent stray capacitance DT Lee, JP Pelz, B Bhushan Review of scientific Instruments 73 (10), 3525-3533, 2002 | 88 | 2002 |
| Successive oxidation stages of adatoms on the Si (111) 7× 7 surface observed with scanning tunneling microscopy and spectroscopy JP Pelz, RH Koch Physical Review B 42 (6), 3761, 1990 | 81 | 1990 |
| Comparison of mixed anion, and mixed cation, metamorphic buffers grown by molecular beam epitaxy on (100) InP substrates MK Hudait, Y Lin, MN Palmisiano, C Tivarus, JP Pelz, SA Ringel Journal of applied physics 95 (8), 3952-3960, 2004 | 80 | 2004 |
| Successive oxidation stages and annealing behavior of the Si (111) 7× 7 surface observed with scanning tunneling microscopy and scanning tunneling spectroscopy JP Pelz, RH Koch Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 1991 | 78 | 1991 |
| Nanometer-Scale Creation and Characterization of Trapped Charge in Si Films Using Ballistic Electron Emission Microscopy B Kaczer, Z Meng, JP Pelz Physical review letters 77 (1), 91, 1996 | 74 | 1996 |
| Evolution of atomic‐scale roughening on Si (001)‐(2× 1) surfaces resulting from high temperature oxidation JV Seiple, JP Pelz Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 13 (3 …, 1995 | 66 | 1995 |
| Tip-related artifacts in scanning tunneling potentiometry JP Pelz, RH Koch Physical Review B 41 (2), 1212, 1990 | 65 | 1990 |
| Scanning-tunneling spectroscopy of surface-state electrons scattered by a slightly disordered two-dimensional dilute “solid”: Ce on Ag (111) M Ternes, C Weber, M Pivetta, F Patthey, JP Pelz, T Giamarchi, F Mila, ... Physical review letters 93 (14), 146805, 2004 | 61 | 2004 |
| Ballistic‐electron emission microscopy studies of charge trapping in SiO2 B Kaczer, JP Pelz Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 1996 | 58 | 1996 |
| Extremely low-noise potentiometry with a scanning tunneling microscope JP Pelz, RH Koch Review of scientific instruments 60 (3), 301-305, 1989 | 58 | 1989 |
| Coverage-dependent self-organization: from individual adatoms to adatom superlattices F Silly, M Pivetta, M Ternes, F Patthey, JP Pelz, WD Schneider New Journal of Physics 6 (1), 16, 2004 | 57 | 2004 |
| Direct observation of conduction-band structure of - and using ballistic electron emission microscopy B Kaczer, HJ Im, JP Pelz, J Chen, WJ Choyke Physical Review B 57 (7), 4027, 1998 | 57 | 1998 |
| Ballistic electron emission microscopy study of Schottky contacts on and SiC HJ Im, B Kaczer, JP Pelz, WJ Choyke Applied physics letters 72 (7), 839-841, 1998 | 53 | 1998 |
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