| Femtosecond X-ray measurement of coherent lattice vibrations near the Lindemann stability limit K Sokolowski-Tinten, C Blome, J Blums, A Cavalleri, C Dietrich, ... Nature 422, 287-289, 2003 | 776 | 2003 |
| Detection of nonthermal melting by ultrafast X-ray diffraction CW Siders, A Cavalleri, K Sokolowski-Tinten, C Tóth, T Guo, M Kammler, ... Science 286 (5443), 1340-1342, 1999 | 751 | 1999 |
| Ultrafast bond softening in bismuth: Mapping a solid's interatomic potential with x-rays DM Fritz, DA Reis, B Adams, RA Akre, J Arthur, C Blome, PH Bucksbaum, ... Science 315 (5812), 633-636, 2007 | 505 | 2007 |
| Influence of surfactants in Ge and Si epitaxy on Si (001) M Copel, MC Reuter, M Horn-von Hoegen, RM Tromp Physical Review B 42 (18), 11682, 1990 | 387 | 1990 |
| Electronic acceleration of atomic motions and disordering in bismuth G Sciaini, M Harb, SG Kruglik, T Payer, CT Hebeisen, FJM Heringdorf, ... Nature 458 (7234), 56-59, 2009 | 361 | 2009 |
| Femtosecond X-ray measurement of ultrafast melting and large acoustic transients K Sokolowski-Tinten, C Blome, C Dietrich, A Tarasevitch, ... Physical Review Letters 87 (22), 225701-225701, 2001 | 348 | 2001 |
| Defect self-annihilation in surfactant-mediated epitaxial growth M Horn-von Hoegen, FK LeGoues, M Copel, MC Reuter, RM Tromp Physical Review Letters 67 (9), 1130-1133, 1991 | 320 | 1991 |
| Anharmonic lattice dynamics in germanium measured with ultrafast X-ray diffraction A Cavalleri, CW Siders, FLH Brown, DM Leitner, C Toth, JA Squier, ... Physical Review Letters 85 (3), 586-589, 2000 | 212 | 2000 |
| Growth of semiconductor layers studied by spot profile analysing low energy electron diffraction-Part I M Horn-von Hoegen Zeitschrift für Kristallographie 214 (10), 591-629, 1999 | 204* | 1999 |
| Interplay of wrinkles, strain, and lattice parameter in graphene on iridium H Hattab, AT N’Diaye, D Wall, C Klein, G Jnawali, J Coraux, C Busse, ... Nano letters 12 (2), 678-682, 2012 | 176 | 2012 |
| Optically excited structural transition in atomic wires on surfaces at the quantum limit T Frigge, B Hafke, T Witte, B Krenzer, C Streubühr, A Samad Syed, ... Nature 544 (7649), 207-211, 2017 | 149 | 2017 |
| In situ observation of stress relaxation in epitaxial graphene R Gastel, AJ Martínez-Galera, J Coraux, H Hattab, D Wall, FJ Heringdorf, ... New Journal of Physics 11, 113056, 2009 | 144 | 2009 |
| A new two‐dimensional particle detector for a toroidal electrostatic analyzer RM Tromp, M Copel, MC Reuter, M Horn von Hoegen, J Speidell, ... Review of scientific instruments 62 (11), 2679-2683, 1991 | 144 | 1991 |
| Selecting a single orientation for millimeter sized graphene sheets R van Gastel, AT N’Diaye, D Wall, J Coraux, C Busse, NM Buckanie, ... Applied physics letters 95 (12), 2009 | 142 | 2009 |
| Growth temperature dependent graphene alignment on Ir (111) H Hattab, AT N’Diaye, D Wall, G Jnawali, J Coraux, C Busse, ... Applied Physics Letters 98 (14), 2011 | 135 | 2011 |
| Layer-by-layer growth of germanium on Si (100): strain-induced morphology and the influence of surfactants U Kohler, O Jusko, B Muller, M Horn-von Hoegen, M Pook Ultramicroscopy 42, 832-837, 1992 | 130 | 1992 |
| Normal-incidence photoemission electron microscopy (NI-PEEM) for imaging surface plasmon polaritons P Kahl, S Wall, C Witt, C Schneider, D Bayer, A Fischer, P Melchior, ... Plasmonics 9, 1401-1407, 2014 | 120 | 2014 |
| Short-range surface plasmonics: Localized electron emission dynamics from a 60-nm spot on an atomically flat single-crystalline gold surface B Frank, P Kahl, D Podbiel, G Spektor, M Orenstein, L Fu, T Weiss, ... Science Advances 3 (7), e1700721, 2017 | 114 | 2017 |
| Strain-relief mechanism in surfactant-grown epitaxial germanium films on Si (111) FK LeGoues, M Horn-von Hoegen, M Copel, RM Tromp Physical Review B 44 (23), 12894, 1991 | 113 | 1991 |
| Ultrafast x-ray measurement of laser heating in semiconductors: Parameters determining the melting threshold A Cavalleri, CW Siders, C Rose-Petruck, R Jimenez, C Tóth, JA Squier, ... Physical Review B 63 (19), 193306-193306, 2001 | 112 | 2001 |
Frank Meyer zu HeringdorfProfessor for Physics / Director ICAN, University of Duisburg-Essen確認したメール アドレス: uni-due.de
