| Silicon-Germanium heterojunction bipolar transistor JD Cressler Device and Circuit Cryogenic Operation for Low Temperature Electronics, 69-84, 2003 | 788 | 2003 |
| SiGe HBT technology: A new contender for Si-based RF and microwave circuit applications JD Cressler IEEE Transactions on Microwave Theory and techniques 46 (5), 572-589, 1998 | 635 | 1998 |
| Si/SiGe epitaxial-base transistors. I. Materials, physics, and circuits DL Harame, JH Comfort, JD Cressler, EF Crabbe, JYC Sun, BS Meyerson, ... IEEE Transactions on Electron Devices 42 (3), 455-468, 1995 | 570 | 1995 |
| Silicon Heterostructure Handbook: Materials, Fabrication, Devices, Circuits and Applications of SiGe and Si Strained-Layer Epitaxy JD Cressler, S Monfray, G Freeman, D Friedman, DJ Paul, S Tsujino, ... CRC press, 2018 | 302 | 2018 |
| Si/SiGe epitaxial-base transistors. II. Process integration and analog applications DL Harame, JH Comfort, JD Cressler, EF Crabbe, JYC Sun, BS Meyerson, ... IEEE Transactions on Electron Devices 42 (3), 469-482, 1995 | 299 | 1995 |
| On the potential of SiGe HBTs for extreme environment electronics JD Cressler Proceedings of the IEEE 93 (9), 1559-1582, 2005 | 298 | 2005 |
| Extreme environment electronics JD Cressler, HA Mantooth CRC Press, 2017 | 297 | 2017 |
| Record maximum oscillation frequency in C-face epitaxial graphene transistors Z Guo, R Dong, PS Chakraborty, N Lourenco, J Palmer, Y Hu, M Ruan, ... Nano letters 13 (3), 942-947, 2013 | 208 | 2013 |
| Reconfigurable RFICs in Si-based technologies for a compact intelligent RF front-end R Mukhopadhyay, Y Park, P Sen, N Srirattana, J Lee, CH Lee, S Nuttinck, ... IEEE Transactions on Microwave Theory and Techniques 53 (1), 81-93, 2005 | 196 | 2005 |
| Radiation effects in SiGe technology JD Cressler IEEE transactions on Nuclear Science 60 (3), 1992-2014, 2013 | 174 | 2013 |
| On the profile design and optimization of epitaxial Si-and SiGe-base bipolar technology for 77 K applications. I. Transistor DC design considerations JD Cressler, JH Comfort, EF Crabbe, GL Patton, JMC Stork, JYC Sun, ... IEEE Transactions on Electron Devices 40 (3), 525-541, 1993 | 154 | 1993 |
| Design and fabrication of planar guard ring termination for high-voltage SiC diodes DC Sheridan, G Niu, JN Merrett, JD Cressler, C Ellis, CC Tin Solid-State Electronics 44 (8), 1367-1372, 2000 | 152 | 2000 |
| Half-terahertz operation of SiGe HBTs R Krithivasan, Y Lu, JD Cressler, JS Rieh, MH Khater, D Ahlgren, ... IEEE electron device letters 27 (7), 567-569, 2006 | 143 | 2006 |
| Multiple-bit upset in 130 nm CMOS technology AD Tipton, JA Pellish, RA Reed, RD Schrimpf, RA Weller, MH Mendenhall, ... IEEE Transactions on Nuclear Science 53 (6), 3259-3264, 2006 | 142 | 2006 |
| A new" mixed-mode" reliability degradation mechanism in advanced Si and SiGe bipolar transistors G Zhang, JD Cressler, G Niu, AJ Joseph IEEE Transactions on Electron Devices 49 (12), 2151-2156, 2002 | 133 | 2002 |
| A unified approach to RF and microwave noise parameter modeling in bipolar transistors G Niu, JD Cressler, S Zhang, WE Ansley, CS Webster, DL Harame IEEE Transactions on Electron Devices 48 (11), 2568-2574, 2001 | 130 | 2001 |
| Autonomous bit error rate testing at multi-gbit/s rates implemented in a 5AM SiGe circuit for radiation effects self test (CREST) P Marshall, M Carts, S Currie, R Reed, B Randall, K Fritz, K Kennedy, ... IEEE transactions on nuclear science 52 (6), 2446-2454, 2005 | 112 | 2005 |
| RF linearity characteristics of SiGe HBTs G Niu, Q Liang, JD Cressler, CS Webster, DL Harame IEEE Transactions on Microwave Theory and Techniques 49 (9), 1558-1565, 2001 | 112 | 2001 |
| A simple four-port parasitic deembedding methodology for high-frequency scattering parameter and noise characterization of SiGe HBTs Q Liang, JD Cressler, G Niu, Y Lu, G Freeman, DC Ahlgren, RM Malladi, ... IEEE Transactions on Microwave Theory and Techniques 51 (11), 2165-2174, 2003 | 107 | 2003 |
| Optimization of SiGe HBT technology for high speed analog and mixed-signal applications DL Harame, JMC Stork, BS Meyerson, KYJ Hsu, J Cotte, KA Jenkins, ... Proceedings of IEEE International Electron Devices Meeting, 71-74, 1993 | 106 | 1993 |
