| Deflectometry for specular surfaces: an overview J Burke, A Pak, S Höfer, M Ziebarth, M Roschani, J Beyerer Advanced Optical Technologies 12, 1237687, 2023 | 43 | 2023 |
| A new FPGA based architecture to improve performance of deflectometry image processing algorithm F Bhatti, T Greiner, M Heizmann, M Ziebarth 2017 40th International Conference on Telecommunications and Signal …, 2017 | 11 | 2017 |
| Inspection of specular surfaces using optimized M-channel wavelets TT Le, M Ziebarth, T Greiner, M Heizmann 2013 IEEE International Conference on Acoustics, Speech and Signal …, 2013 | 9 | 2013 |
| Defect classification on specular surfaces using wavelets A Hahn, M Ziebarth, M Heizmann, A Rieder Scale Space and Variational Methods in Computer Vision: 4th International …, 2013 | 9 | 2013 |
| Systematic design of object shape matched wavelet filter banks for defect detection TT Le, M Ziebarth, T Greiner, M Heizmann 2016 39th International Conference on Telecommunications and Signal …, 2016 | 8 | 2016 |
| Empirical comparison of defect classifiers on specular surfaces M Ziebarth Proc. 2013 Joint Workshop Fraunhofer IOSB and Inst. for Anthropomatics …, 2014 | 8 | 2014 |
| Optimized size-adaptive feature extraction based on content-matched rational wavelet filters TT Le, M Ziebarth, T Greiner, M Heizmann 2014 22nd European Signal Processing Conference (EUSIPCO), 1672-1676, 2014 | 7 | 2014 |
| Obtaining 2d surface characteristics from specular surfaces M Ziebarth, M Vogelbacher, S Olawsky, J Beyerer Pattern Recognition: 36th German Conference, GCPR 2014, Münster, Germany …, 2014 | 5 | 2014 |
| Wahrnehmungsgrenzen kleiner Verformungen auf spiegelnden Oberflächen M Ziebarth KIT Scientific Publishing, 2019 | 4 | 2019 |
| Inspektion spiegelnder Oberflächen mit Wavelet-basierten Verfahren M Ziebarth, TT Le, T Greiner, M Heizmann Forum Bildverarbeitung, 167-180, 2012 | 4 | 2012 |
| Defect perception thresholds on specular surfaces M Ziebarth Proc. 2014 Joint Workshop of Fraunhofer IOSB and Inst. for Anthropomatics …, 2015 | 3 | 2015 |
| Segmentierung unterschiedlich stark ausgeprägter Welligkeiten auf lackierten Oberflächen M Vogelbacher, M Ziebarth, S Olawsky, J Beyerer tm-Technisches Messen 81 (12), 644-651, 2014 | 3 | 2014 |
| Modeling the unified measurement uncertainty of deflectometric and plenoptic 3-D sensors M Ziebarth, N Zeller, M Heizmann, F Quint Journal of Sensors and Sensor Systems 7 (2), 517-533, 2018 | 2 | 2018 |
| Creating patterns for phase shifting by rotation in deflectometry M Ziebarth, T Stephan, S Höfer, J Burke DGaO Proceedings 2017, 2017 | 2 | 2017 |
| Methods for multiscale evaluation of deflectometric measurements M Ziebarth Proceedings of the 2012 Joint Workshop of Fraunhofer IOSB and Institute for …, 2013 | 2 | 2013 |
| Beurteilung textiler Flächenhalbzeuge mittels variabler Beleuchtung M Vogelbacher, S Werling, M Ziebarth Forum Bildverarbeitung, 193-204, 2012 | 2 | 2012 |
| Kontextbezogene Verarbeitung und Erfassung von 3D-Daten: Ein serviceorientiertes System im Rahmen von I4. 0-Anwendungen F Bhatti, G Engel, M Engelsberger, M Ziebert, N Zeller, J Beyerer, ... atp magazin 61 (3), 76-86, 2019 | 1 | 2019 |
| Context aware 3D image processing acquisition: A service-oriented system in scope of I4. 0 applications F Bhatti, G Engel, M Engelsberger, M Ziebarth, N Zeller, J Beyerer, ... Atp-Edition, 2019 | 1 | 2019 |
| Multiskalige Oberflächeninspektion mit Wavelets und Deflektometrie T Greiner, TT Le, M Ziebarth, M Heizmann tm-Technisches Messen 83 (11), 617-627, 2016 | 1 | 2016 |
| Sichtbarkeit von Dellen und Beulen auf spiegelnden Oberflächen M Ziebarth, M Heizmann, J Beyerer Forum Bildverarbeitung 2014, 153-165, 2014 | 1 | 2014 |
Juergen BeyererProfessor für Informatik KIT Karlsruhe und Leiter des Fraunhofer-IOSB確認したメール アドレス: iosb.fraunhofer.de