| Estimation of remaining useful life of ball bearings using data driven methodologies E Sutrisno, H Oh, ASS Vasan, M Pecht 2012 ieee conference on prognostics and health management, 1-7, 2012 | 254 | 2012 |
| MEMS reliability review Y Huang, ASS Vasan, R Doraiswami, M Osterman, M Pecht IEEE Transactions on Device and Materials Reliability 12 (2), 482-493, 2012 | 226 | 2012 |
| Diagnostics and prognostics method for analog electronic circuits ASS Vasan, B Long, M Pecht IEEE Transactions on Industrial Electronics 60 (11), 5277-5291, 2012 | 223 | 2012 |
| A status review of photovoltaic power conversion equipment reliability, safety, and quality assurance protocols P Hacke, S Lokanath, P Williams, A Vasan, P Sochor, GS TamizhMani, ... Renewable and Sustainable Energy Reviews 82, 1097-1112, 2018 | 124 | 2018 |
| Center for Advanced Life Cycle Engineering (CALCE), University of Maryland, College Park, Maryland 20742, USA, 2Center for Prognostics and system health management, city … ASS Vasan, DM Mahadeo, R Doraiswami, Y Huang, M Pecht Frontiers in bioscience 5, 39-71, 2013 | 80 | 2013 |
| Carbon footprinting of electronic products A Vasan, B Sood, M Pecht Applied energy 136, 636-648, 2014 | 49 | 2014 |
| Electronic circuit health estimation through kernel learning ASS Vasan, MG Pecht IEEE Transactions on Industrial Electronics 65 (2), 1585-1594, 2017 | 27 | 2017 |
| Experimental validation of LS-SVM based fault identification in analog circuits using frequency features ASS Vasan, B Long, M Pecht Engineering Asset Management 2011, 629-641, 2014 | 21 | 2014 |
| Energy harvesting using RF MEMS R Doraiswami, MG Pecht, ASS Vasan, Y Huang, AM Kluger US Patent 8,859,879, 2014 | 13 | 2014 |
| Performance analysis of multicell multiuser MIMO MC DS/CDMA system with MMSE user-ordered SIC technique P Nagaradjane, L Krishnan, ASS Vasan Computers & Electrical Engineering 38 (1), 105-115, 2012 | 12 | 2012 |
| Joint VBLAST/STBC assisted MC DS/CDMA system with multiuser detection P Nagaradjane, ASS Vasan, L Krishnan, A Venkataswamy 2009 5th International Conference on Wireless Communications, Networking and …, 2009 | 12 | 2009 |
| Defining humidity test duration for microinverter reliability assessment: A physics-of-failure approach A Vasan, L Laskai, M Ilic 2017 IEEE Applied Power Electronics Conference and Exposition (APEC), 2336-2340, 2017 | 9 | 2017 |
| Health and Remaining Useful Life Estimation of Electronic Circuits ASS Vasan, MG Pecht Prognostics and Health Management of Electronics: Fundamentals, Machine …, 2018 | 7 | 2018 |
| A circuit-centric approach to electronic system-level diagnostics and prognostics ASS Vasan, C Chen, M Pecht 2013 IEEE conference on prognostics and health management (PHM), 1-8, 2013 | 7 | 2013 |
| Investigation of stochastic differential models and a recursive nonlinear filtering approach for fusion-prognostics ASS Vasan, M Pecht Proceeding of Annual Conference of the Prognostics and Health Management …, 2011 | 7 | 2011 |
| A robust space time co-channel interference mitigation and detection technique for Multiuser MIMO Multicarrier DS/CDMA systems P Nagaradjane, ASS Vasan, L Krishnan 2009 1st International Conference on Wireless Communication, Vehicular …, 2009 | 7 | 2009 |
| A New Application for Failure Prognostics – Reduction of Automotive Electronics Reliability Test Duration AVMP Andre Kleyner Annual Conference of the Prognostics and Health Management Society 2017, 1-9, 2017 | 6* | 2017 |
| Health assessment of electronic systems ASS Vasan, M Pecht, B Long 2013 International Conference on Quality, Reliability, Risk, Maintenance …, 2013 | 6 | 2013 |
| Fusion prognostics-based qualification of microelectronic devices M Pecht, E George, A Vasan, P Chauhan Proceedings of the 21th International Symposium on the Physical and Failure …, 2014 | 4 | 2014 |
| Health estimation and remaining useful life prediction of electronic circuit with a parametric fault ASS Vasan University of Maryland, College Park, 2016 | 3 | 2016 |
Hyunseok OhGwangju Institute of Science and Technology (GIST)確認したメール アドレス: gist.ac.kr