מאמרים עם הרשאות לגישה ציבורית - Patrick Girardלמידע נוסף
לא זמינים באתר כלשהו: 39
Information assurance through redundant design: A novel TNU error-resilient latch for harsh radiation environment
A Yan, Y Hu, J Cui, Z Chen, Z Huang, T Ni, P Girard, X Wen
IEEE Transactions on Computers 69 (6), 789-799, 2020
הרשאות: National Natural Science Foundation of China
Novel quadruple-node-upset-tolerant latch designs with optimized overhead for reliable computing in harsh radiation environments
A Yan, Z Xu, X Feng, J Cui, Z Chen, T Ni, Z Huang, P Girard, X Wen
IEEE transactions on emerging topics in computing 10 (1), 404-413, 2020
הרשאות: National Natural Science Foundation of China
Novel speed-and-power-optimized SRAM cell designs with enhanced self-recoverability from single-and double-node upsets
A Yan, Y Chen, Y Hu, J Zhou, T Ni, J Cui, P Girard, X Wen
IEEE Transactions on Circuits and Systems I: Regular Papers 67 (12), 4684-4695, 2020
הרשאות: National Natural Science Foundation of China
Quadruple cross-coupled dual-interlocked-storage-cells-based multiple-node-upset-tolerant latch designs
A Yan, Y Ling, J Cui, Z Chen, Z Huang, J Song, P Girard, X Wen
IEEE Transactions on Circuits and Systems I: Regular Papers 67 (3), 879-890, 2020
הרשאות: National Natural Science Foundation of China
Designs of BCD adder based on excess-3 code in quantum-dot cellular automata
A Yan, R Liu, J Cui, T Ni, P Girard, X Wen, J Zhang
IEEE Transactions on Circuits and Systems II: Express Briefs 70 (6), 2256-2260, 2023
הרשאות: National Natural Science Foundation of China
Two double-node-upset-hardened flip-flop designs for high-performance applications
A Yan, A Cao, Z Huang, J Cui, T Ni, P Girard, X Wen, J Zhang
IEEE Transactions on Emerging Topics in Computing 11 (4), 1070-1081, 2023
הרשאות: Chinese Academy of Sciences, National Natural Science Foundation of China
Designs of two quadruple-node-upset self-recoverable latches for highly robust computing in harsh radiation environments
A Yan, Z Li, J Cui, Z Huang, T Ni, P Girard, X Wen
IEEE Transactions on Aerospace and Electronic Systems 59 (3), 2885-2897, 2022
הרשאות: Chinese Academy of Sciences, National Natural Science Foundation of China
FeMPIM: a FeFET-based multifunctional processing-in-memory cell
A Yan, Y Chen, Z Gao, T Ni, Z Huang, J Cui, P Girard, X Wen
IEEE Transactions on Circuits and Systems II: Express Briefs 71 (4), 2299-2303, 2023
הרשאות: Chinese Academy of Sciences, National Natural Science Foundation of China
MURLAV: a multiple-node-upset recovery latch and algorithm-based verification method
A Yan, Z Li, Z Gao, J Zhang, Z Huang, T Ni, J Cui, X Wang, P Girard, ...
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2024
הרשאות: National Natural Science Foundation of China
Nonvolatile latch designs with node-upset tolerance and recovery using magnetic tunnel junctions and CMOS
A Yan, L Wang, J Cui, Z Huang, T Ni, P Girard, X Wen
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 32 (1), 116-127, 2023
הרשאות: Chinese Academy of Sciences, National Natural Science Foundation of China
A novel low-cost TMR-without-voter based HIS-insensitive and MNU-tolerant latch design for aerospace applications
A Yan, Z Xu, K Yang, J Cui, Z Huang, P Girard, X Wen
IEEE Transactions on Aerospace and Electronic Systems 56 (4), 2666-2676, 2019
הרשאות: National Natural Science Foundation of China
LDAVPM: A latch design and algorithm-based verification protected against multiple-node-upsets in harsh radiation environments
A Yan, Z Li, J Cui, Z Huang, T Ni, P Girard, X Wen
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2022
הרשאות: Chinese Academy of Sciences, National Natural Science Foundation of China
Cost-effective and highly reliable circuit-components design for safety-critical applications
A Yan, Z Fan, L Ding, J Cui, Z Huang, Q Wang, H Zheng, P Girard, X Wen
IEEE Transactions on Aerospace and Electronic Systems 58 (1), 517-529, 2021
הרשאות: National Natural Science Foundation of China
Design of double-upset recoverable and transient-pulse filterable latches for low-power and low-orbit aerospace applications
A Yan, Y Chen, Z Xu, Z Chen, J Cui, Z Huang, P Girard, X Wen
IEEE Transactions on Aerospace and Electronic Systems 56 (5), 3931-3940, 2020
הרשאות: National Natural Science Foundation of China
HITTSFL: design of a cost-effective HIS-Insensitive TNU-Tolerant and SET-Filterable latch for safety-critical applications
A Yan, X Feng, X Zhao, H Zhou, J Cui, Z Ying, P Girard, X Wen
2020 57th ACM/IEEE Design Automation Conference (DAC), 1-6, 2020
הרשאות: National Natural Science Foundation of China
Dual-modular-redundancy and dual-level error-interception based triple-node-upset tolerant latch designs for safety-critical applications
A Yan, Z He, J Zhou, J Cui, T Ni, Z Huang, X Wen, P Girard
Microelectronics Journal 111, 105034, 2021
הרשאות: National Natural Science Foundation of China
Design of a highly reliable SRAM cell with advanced self-recoverability from soft errors
Z Dou, A Yan, J Zhou, Y Hu, Y Chen, T Ni, J Cui, P Girard, X Wen
2020 IEEE International Test Conference in Asia (ITC-Asia), 35-40, 2020
הרשאות: National Natural Science Foundation of China
Cell-aware defect diagnosis of customer returns based on supervised learning
S Mhamdi, P Girard, A Virazel, A Bosio, E Faehn, A Ladhar
IEEE Transactions on Device and Materials Reliability 20 (2), 329-340, 2020
הרשאות: Agence Nationale de la Recherche
Sclcrl: Shuttling c-elements based low-cost and robust latch design protected against triple node upsets in harsh radiation environments
A Yan, Z Li, S Huang, Z Zhai, X Cheng, J Cui, T Ni, X Wen, P Girard
2022 Design, Automation & Test in Europe Conference & Exhibition (DATE …, 2022
הרשאות: Chinese Academy of Sciences, National Natural Science Foundation of China
A learning-based cell-aware diagnosis flow for industrial customer returns
S Mhamdi, P Girard, A Virazel, A Bosio, A Ladhar
2020 IEEE International Test Conference (ITC), 1-10, 2020
הרשאות: Agence Nationale de la Recherche
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