| Test data analytics—Exploring spatial and test-item correlations in production test data CK Hsu, F Lin, KT Cheng, W Zhang, X Li, JM Carulli, KM Butler 2013 IEEE International Test Conference (ITC), 1-10, 2013 | 44 | 2013 |
| Feature engineering with canonical analysis for effective statistical tests screening test escapes F Lin, CK Hsu, KT Cheng 2014 International Test Conference, 1-10, 2014 | 16 | 2014 |
| Learning from production test data: Correlation exploration and feature engineering F Lin, CK Hsu, KT Cheng 2014 IEEE 23rd Asian Test Symposium, 236-241, 2014 | 15 | 2014 |
| Adatest: An efficient statistical test framework for test escape screening F Lin, CK Hsu, KT Cheng 2015 IEEE International Test Conference (ITC), 1-8, 2015 | 14 | 2015 |
| Joint virtual probe: Joint exploration of multiple test items' spatial patterns for efficient silicon characterization and test prediction S Zhang, F Lin, CK Hsu, KT Cheng, H Wang 2014 Design, Automation & Test in Europe Conference & Exhibition (DATE), 1-6, 2014 | 14 | 2014 |
| Variation and failure characterization through pattern classification of test data from multiple test stages CK Hsu, P Sarson, G Schatzberger, F Leisenberger, J Carulli, ... 2016 IEEE International Test Conference (ITC), 1-10, 2016 | 9 | 2016 |
| Pairwise proximity-based features for test escape screening F Lin, CK Hsu, AG Busetto, KT Cheng 2015 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 300-306, 2015 | 6 | 2015 |
| Processor and DRAM integration by TSV-based 3-D stacking for power-aware SOCs SS Chen, CK Hsu, HC Shih, JC Yeh, CW Wu 2013 18th Asia and South Pacific Design Automation Conference (ASP-DAC), 429-434, 2013 | 3 | 2013 |
| Area and test cost reduction for on-chip wireless test channels with system-level design techniques CK Hsu, LM Denq, MY Wang, JJ Liou, CT Huang, CW Wu 2008 17th Asian Test Symposium, 245-250, 2008 | 3 | 2008 |
| Test data analytics: Exploration of hidden patterns for test cost reduction and silicon characterization CK Hsu University of California, Santa Barbara, 2016 | 2 | 2016 |
| TDATA—Test Data Analytics Toolbox CK Hsu, F Lin | | 2016 |
Kwang-Ting (Tim) ChengChair Professor of ECE and CSE, HKUSTכתובת אימייל מאומתת בדומיין ust.hk