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Coautori
- Terence HookIBMEmail verificata su us.ibm.com
- Jed RankinIBMEmail verificata su ibm.com
- Benton CalhounProfessor of Electrical and Computer Engineering, University of VirginiaEmail verificata su virginia.edu
- Jiajing WangPrinciple Hardware Engineer, Oracle Corp.Email verificata su oracle.com
- James W AdkissonIBMEmail verificata su us.ibm.com
- Carl RadensIBM ResearchEmail verificata su ibm.com
- Azeez BhavnagarwalaMetis MicrosystemsEmail verificata su metismicro.com
- Brent AndersonSenior Staff Engineer at IBMEmail verificata su us.ibm.com
- Sudhanshu KhannaTexas Instruments DallasEmail verificata su ti.com
- Christian LavoieManager Advanced Characterization, IBM T.J. Watson Research Center, Yorktown Heights, NYEmail verificata su us.ibm.com
- David J FrankIBM Watson Research CenterEmail verificata su us.ibm.com
- SUBRAMANIAN S. IYERUniversity of California at Los Angeles,Email verificata su g.ucla.edu
- Yoann Mamy RandriamihajaEmail verificata su st.com
- Mircea R. StanVirginia Microelectronics Consortium (VMEC) Professor, University of VirginiaEmail verificata su virginia.edu
- Vivek JoshiGLOBALFOUNDRIES, University of MichiganEmail verificata su umich.edu