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- Kwangsoo NoKAISTEmail verificata su kaist.ac.kr
- Hyunjung ShinSungkyunkwan UniversityEmail verificata su skku.edu
- Dong-Ki MinSamsung electronicsEmail verificata su samsung.com
- Nava SetterDepartment of Materials Science and Engineering, Tel Aviv UniversityEmail verificata su post.tau.ac.il
- Yunseok KimSungkyunkwan University (SKKU)Email verificata su skku.edu
- Jaegyu KimPostdoctoral Researcher, UC BerkeleyEmail verificata su berkeley.edu
- Enrico CollaInstitute of Materials, EPFL, LausanneEmail verificata su infoprint.ch
- Ram S. KatiyarProfessor of Physics,University of Puerto Rico, San Juan, PR, USAEmail verificata su upr.edu
- Charudatta PhatakMaterials ScientistEmail verificata su anl.gov
- Stephen StreifferOak Ridge National LaboratoryEmail verificata su ornl.gov
- Jiwon YeomSamsung Advanced Institute of TechnologyEmail verificata su samsung.com
- Y. Eugene PakDepartment of Mechanical Engineering, SUNY KoreaEmail verificata su sunykorea.ac.kr
- Hongsik ParkProfessor, School of Electronics Engineering, Kyungpook National UniversityEmail verificata su ee.knu.ac.kr
- A TagantsevEPFLEmail verificata su epfl.ch
- Igor StolichnovEPFL (École Polytechnique Fédérale de Lausanne), Lausanne, SwitzerlandEmail verificata su epfl.ch
- Orlando AucielloProfessor at University of Texas at DallasEmail verificata su utdallas.edu
- Yogesh SharmaLam ResearchEmail verificata su lamresearch.com
- Tae hyun SungHanyang university, prof.Email verificata su ehanyang.ac.kr
- Radhe AgarwalPostdoctoral Research Scientist, Drexel UniversityEmail verificata su drexel.edu
- Jongin HongChung-Ang UniversityEmail verificata su cau.ac.kr