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Ashwin A. SeshiaUniversity of Cambridge, IIT BombayEmail verificata su cam.ac.uk
Guillermo SobrevielaResearch Associate in Microsystems (MEMS), University of CambridgeEmail verificata su cam.ac.uk
Chun ZhaoLecturer (Assistant Professor) in Microengineering, University of YorkEmail verificata su york.ac.uk
Xudong ZouInstitute of Electronics, Chinese Academy of SciencesEmail verificata su mail.ie.ac.cn
Arif MustafazadeVSL - Dutch National Metrology InstituteEmail verificata su vsl.nl
Hemin Zhang (张和民)Professor, Northwestern Polytechnical University, ChinaEmail verificata su nwpu.edu.cn
Sijun DuAssistant Professor, Delft University of TechnologyEmail verificata su tudelft.nl
Dongyang ChenZhejiang UniversityEmail verificata su zju.edu.cn
John D.W. MaddenElectrical and Computer Engineering, University of British Columbia, V6T 1Z4Email verificata su ece.ubc.ca
Soheil KianzadPhD, University of British ColumbiaEmail verificata su cs.ubc.ca
Frank KoUniversity of British ColumbiaEmail verificata su ubc.ca
Cuong DoVinUniversity, University of CambridgeEmail verificata su cam.ac.uk
Geoffrey SpinksUniversity of WollongongEmail verificata su uow.edu.au