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- Chengwu TaoSr. Staff Scientist, BroadcomEmail verificata su broadcom.com
- Mohammed IsmailProfessor and Chair, Electrical and Computer Engineering Department, Wayne State UniversityEmail verificata su wayne.edu
- Baher HarounTexas Instruments Senior Fellow, FIEEEEmail verificata su ti.com
- Yogesh RamadassSenior Director - Nanotech/MEMS/Sensors, Kilby Labs, Texas InstrumentsEmail verificata su ti.com
- Russell G. ByrdSenior Analog/Mixed-Signal IC Design Engineer @ Texas InstrumentsEmail verificata su ti.com
- Yongjie JiangAppleEmail verificata su apple.com
- Anant AgarwalProfessor of Electrical Engineering, Ohio State UniversityEmail verificata su ieee.org
- Sundar IsukapatiSUNY Polytechnic InstituteEmail verificata su sunypoly.edu
- Tianshi LiuThe Ohio State UniversityEmail verificata su osu.edu
- Adam J MorganNoMIS Power & SUNY RFEmail verificata su nomispower.com
- Muhammad Swilam AhmedDesign Engineer, Texas Instruments Inc.Email verificata su ti.com
- Anantha ChandrakasanDean of Engineering, Massachusetts Institute of TechnologyEmail verificata su mit.edu
- Ahmed A AbdelmoatyThe Ohio State UniversityEmail verificata su osu.edu
- Manmeet SinghPhD Candidate at Ohio State UniversityEmail verificata su buckeyemail.osu.edu
- Bora TarSr. Design Engineer, The Ohio State UniversityEmail verificata su osu.edu
- Ying-Chih HsutsmcEmail verificata su tsmc.com
- Mohamed Wahba ElmahalawyUniversity of California, Santa BarbaraEmail verificata su ucsb.edu
- Henry L. (Hal) EdwardsTI Fellow at Texas InstrumentsEmail verificata su ti.com
- Gabriel GomezDesign Manager (DMTS) at Texas InstrumentsEmail verificata su ti.com
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Ayman Fayed
Professor, Electrical and Computer Engineering, The Ohio State University
Email verificata su osu.edu - Home page