| Fault Classification and Coverage of Analog Circuits using DC Operating Point and Frequency Response Analysis S Sanyal, SPPK Garapati, A Patra, P Dasgupta, M Bhattacharya Proceedings of the 2019 on Great Lakes Symposium on VLSI, 123-128, 2019 | 10 | 2019 |
| A Structured Approach for Rapid Identification of Fault-Sensitive Nets in Analog Circuits S Sanyal, A Patra, P Dasgupta, M Bhattacharya 2019 IEEE 28th Asian Test Symposium (ATS), 135-1355, 2019 | 9 | 2019 |
| CoveRT: A Coverage Reporting Tool for Analog Mixed-Signal Designs S Sanyal, A Hazra, P Dasgupta, S Morrison, S Surendran, ... 2020 33rd International Conference on VLSI Design and 2020 19th …, 2020 | 6 | 2020 |
| A Framework for Automated Feature Based Mixed-Signal Equivalence Checking A Ain, S Sanyal, P Dasgupta VLSI Design and Test: 21st International Symposium, VDAT 2017, Roorkee …, 2017 | 5 | 2017 |
| Recurrence in Dense-time AMS Assertions S Sanyal, AAB da Costa, P Dasgupta IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2020 | 4 | 2020 |
| The Notion of Cross Coverage in AMS Design Verification S Sanyal, A Hazra, P Dasgupta, S Morrison, S Surendran, ... 2020 25th Asia and South Pacific Design Automation Conference (ASP-DAC), 217-222, 2020 | 3 | 2020 |
| The CoveRT Approach for Coverage Management in Analog and Mixed-Signal Integrated Circuits S Sanyal, P Dasgupta, A Hazra, S Das, S Morrison, S Surendran, ... IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2022 | 2 | 2022 |
| CoVerPlan: A Comprehensive Verification Planning Framework Leveraging PSS Specifications S Das, S Sanyal, A Hazra, P Dasgupta ACM Transactions on Design Automation of Electronic Systems 28 (1), 1-32, 2022 | 1 | 2022 |
| A Methodology for Identification of Internal Nets for Improving Fault Coverage in Analog and Mixed Signal Circuits S Sanyal, M Bhattacharya, A Patra, P Dasgupta Journal of Electronic Testing 36, 719-730, 2020 | 1 | 2020 |
| Fault Vulnerability Ranking of Transistors in Analog Integrated Circuits using AC Analysis SPPK Garapati, S Sanyal, A Patra, P Dasgupta, M Bhattacharya 2020 IEEE International Test Conference India, 1-8, 2020 | 1 | 2020 |
| TRACKING COVERAGE ARTIFACTS FOR PERIODIC SIGNALS USING SEQUENCE-BASED ABSTRACTIONS A Chakraborty, S Sanyal, P Dasgupta, A Hazra, S Morrison, S Surendran, ... US Patent App. 18/076,547, 2024 | | 2024 |
| Identifying glitches and levels in mixed-signal waveforms S Sanyal, P Dasgupta, A Hazra, S Morrison, S Surendran, ... US Patent App. 18/071,917, 2023 | | 2023 |
| Analog Coverage-driven Selection of Simulation Corners for AMS Integrated Circuits S Sanyal, A Hazra, P Dasgupta, S Morrison, S Surendran, ... 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE), 1-6, 2023 | | 2023 |
| Transistor—level defect coverage and defect simulation M Bhattacharya, S Sanyal, A Patra, P Dasgupta US Patent 11,620,424, 2023 | | 2023 |
| Accelerating Defect Simulation in Analog and Mixed-Signal Circuits by Parallel Defect Injection S Sanyal, M Bhattacharya, P Dasgupta, A Patra 2023 36th International Conference on VLSI Design and 2023 22nd …, 2023 | | 2023 |
| Design Automation for Functional and Defect Coverage in Mixed-Signal Integrated Circuits S Sanyal IIT Kharagpur, 2023 | | 2023 |
| Tracking Coverage Artefacts for Periodic Signals using Sequence-based Abstractions A Chakraborty, S Sanyal, P Dasgupta, A Hazra, S Morrison, S Surendran, ... 2022 35th International Conference on VLSI Design and 2022 21st …, 2022 | | 2022 |
| A machine learning approach for choosing component level conditions for prognostics of AMS systems S Sanyal, A Ain, P Dasgupta 2018 International Symposium on Devices, Circuits and Systems (ISDCS), 1-6, 2018 | | 2018 |
Pallab DasguptaIndian Institute of Technology KharagpurEmail verificata su cse.iitkgp.ac.in