Segui
James C. M. Hwang
James C. M. Hwang
Professor of Materials Science and Engineering, Cornell University
Email verificata su cornell.edu
Titolo
Citata da
Citata da
Anno
GaN metal-oxide-semiconductor high-electron-mobility transistor with atomic layer deposition Al2O3 as gate dielectric
PD Ye, B Yang, KK Ng, J Bude, GD Wilk, S Halder, JCM Hwang
Appl. Phys. Lett. 86 (6), 063501-063503, 2005
5992005
2D materials advances: from large scale synthesis and controlled heterostructures to improved characterization techniques, defects and applications
Z Lin, A McCreary, N Briggs, S Subramanian, K Zhang, Y Sun, X Li, ...
2D Materials 3 (4), 042001, 2016
5512016
Dimensional resonance of the two-dimensional electron gas in selectively doped GaAs/AlGaAs heterostructures
SJ Allen, HL Stormer, JCM Hwang
Phys. Rev. B 28 (8), 4875-4877, 1983
4121983
Fractional quantization of the Hall effect
HL Stormer, A Chang, DC Tsui, JCM Hwang, AG Gossard, W Wiegmann
Phys. Rev. Lett. 50 (24), 1953-1956, 1983
3861983
Black phosphorus and its isoelectronic materials
F Xia, H Wang, JCM Hwang, AHC Neto, L Yang
Nature Reviews Physics 1 (5), 306-317, 2019
2862019
Parabolic magnetoresistance from the interaction effect in a two-dimensional electron gas
MA Paalanen, DC Tsui, JCM Hwang
Phys. Rev. Lett. 51 (24), 2226-2229, 1983
2181983
Subband-Landau-level coupling in a two-dimensional electron gas
Z Schlesinger, JCM Hwang, SJ Allen
Phys. Rev. Lett. 50 (26), 2098-2101, 1983
1601983
Higher-order states in the multiple-series, fractional, quantum Hall effect
AM Chang, P Berglund, DC Tsui, HL Stormer, JCM Hwang
Phys. Rev. Lett. 53 (10), 997-1000, 1984
1551984
Modeling and characterization of dielectric-charging effects in RF MEMS capacitive switches
X Yuan, JCM Hwang, D Forehand, CL Goldsmith
IEEE MTT-S International Microwave Symposium Digest, 2005., 753-756, 2005
1432005
Initial observation and analysis of dielectric-charging effects on RF MEMS capacitive switches
X Yuan, SV Cherepko, JCM Hwang, CL Goldsmith, C Nordquist, C Dyck
IEEE MTT-S Int. Microwave Symp. (IMS) Dig., Fort Worth, TX, 1943-1946, 2004
1252004
Study of persistent photoconductivity effect in n-type selectively doped AlGaAs/GaAs heterojunction
A Kastalsky, JCM Hwang
Solid State Commun. 51 (5), 317-322, 1984
1191984
0.8-V supply voltage deep-submicrometer inversion-mode In0.75Ga0.25As MOSFET
YQ Wu, WK Wang, O Koybasi, DN Zakharov, EA Stach, S Nakahara, ...
IEEE Electron Device Lett. 30 (7), 700-702, 2009
117*2009
Cyclotron resonance in two dimensions
Z Schlesinger, SJ Allen, JCM Hwang, PM Platzman, N Tzoar
Phys. Rev. B 30 (1), 435-437, 1984
1171984
Measurement of grain-boundary diffusion at low temperatures by the surface accumulation method. I. Methods and analysis
JCM Hwang, RW Balluffi
J. Appl. Phys. 50 (3), 1349-1359, 1979
1171979
Activation energies and localization in the fractional quantum Hall effect
GS Boebinger, HL Stormer, DC Tsui, AM Chang, JCM Hwang, AY Cho, ...
Phys. Rev. B 36 (15), 7919-7929, 1987
1131987
Characterization of high-purity Si-doped molecular beam epitaxial GaAs
BJ Skromme, SS Bose, B Lee, TS Low, ...
J. Appl. Phys. 58 (12), 4685-4702, 1985
1111985
Direct extraction of equivalent circuit parameters for heterojunction bipolar transistors
CJ Wei, JCM Hwang
IEEE Transactions on Microwave Theory and Techniques 43 (9), 2035-2040, 1995
1051995
Electron-beam fabrication of GaAs low-noise MESFETs using a new tri-layer resist technique
PC Chao, PM Smith, SC Palmateer, JCM Hwang
IEEE Trans. Electron Devices 32 (6), 1042-1046, 1985
1041985
Acceleration of dielectric charging in RF MEMS capacitive switches
X Yuan, Z Peng, JCM Hwang, D Forehand, CL Goldsmith
IEEE Transactions on device and materials reliability 6 (4), 556-563, 2006
1022006
GaN HEMTs on Si with regrown contacts and cutoff/maximum oscillation frequencies of 250/204 GHz
L Li, K Nomoto, M Pan, W Li, A Hickman, J Miller, K Lee, Z Hu, SJ Bader, ...
IEEE Electron Device Letters 41 (5), 689-692, 2020
1012020
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