| Direct observation of a carbon filament in water-resistant organic memory BH Lee, H Bae, H Seong, DI Lee, H Park, YJ Choi, SG Im, SO Kim, ... ACS nano 9 (7), 7306-7313, 2015 | 109 | 2015 |
| Comprehensive Analysis of Gate-Induced Drain Leakage in Vertically Stacked Nanowire FETs: Inversion-mode vs. Junctionless-mode J Hur, BH Lee, MH Kang, D Ahn, T Bang, S Jeon, YK Choi IEEE Electron Device Letters 37 (5), 541-544, 2016 | 90 | 2016 |
| A Vertically Integrated Junctionless Nanowire Transistor BH Lee, J Hur, MH Kang, T Bang, DC Ahn, D Lee, KH Kim, YK Choi Nano Letters 16 (3), 1840-1847, 2016 | 75 | 2016 |
| Vertically integrated multiple nanowire field effect transistor BH Lee, MH Kang, DC Ahn, JY Park, T Bang, SB Jeon, J Hur, D Lee, ... Nano Letters 15 (12), 8056-8061, 2015 | 70 | 2015 |
| Foldable and disposable memory on paper BH Lee, DI Lee, H Bae, H Seong, SB Jeon, ML Seol, JW Han, ... Scientific Reports 6 (1), 38389, 2016 | 46 | 2016 |
| Logic circuits composed of flexible carbon nanotube thin-film transistor and ultra-thin polymer gate dielectric D Lee, J Yoon, J Lee, BH Lee, ML Seol, H Bae, SB Jeon, H Seong, SG Im, ... Scientific reports 6 (1), 26121, 2016 | 44 | 2016 |
| Nanoscale FET-based transduction toward sensitive extended-gate biosensors J Kwon, BH Lee, SY Kim, JY Park, H Bae, YK Choi, JH Ahn ACS sensors 4 (6), 1724-1729, 2019 | 41 | 2019 |
| Investigation of self-heating effects in gate-all-around MOSFETs with vertically stacked multiple silicon nanowire channels JY Park, BH Lee, KS Chang, DU Kim, C Jeong, CK Kim, H Bae, YK Choi IEEE Transactions on Electron Devices 64 (11), 4393-4399, 2017 | 37 | 2017 |
| A comparative study on hot-carrier injection in 5-story vertically integrated inversion-mode and junctionless-mode gate-all-around MOSFETs SY Kim, BH Lee, J Hur, JY Park, SB Jeon, SW Lee, YK Choi IEEE Electron Device Letters 39 (1), 4-7, 2017 | 27 | 2017 |
| Electro-Thermal Local Annealing for Repair of Total Ionzing Dose Induced Damages in Gate-All-Around MOSFETs JY Park, DI Moon, H Bae, YT Roh, ML Seol, BH Lee, HC Lee, YK Choi IEEE Electron Device Letters 37 (7), 843-846, 2016 | 26* | 2016 |
| Low-frequency noise characteristics in SONOS flash memory with vertically stacked nanowire FETs T Bang, BH Lee, CK Kim, DC Ahn, SB Jeon, MH Kang, JS Oh, YK Choi IEEE Electron Device Letters 38 (1), 40-43, 2016 | 24 | 2016 |
| Three-dimensional fin-structured semiconducting carbon nanotube network transistor D Lee, BH Lee, J Yoon, DC Ahn, JY Park, J Hur, MS Kim, SB Jeon, ... ACS nano 10 (12), 10894-10900, 2016 | 23 | 2016 |
| Quantitative analysis of high-pressure deuterium annealing effects on vertically stacked gate-all-around SONOS memory JM Yu, JY Park, TJ Yoo, JK Han, DH Yun, GB Lee, J Hur, BH Lee, SY Kim, ... IEEE Transactions on Electron Devices 67 (9), 3903-3907, 2020 | 21 | 2020 |
| Controlled Anisotropic Wetting of Scalloped Silicon Nanogroove GH Kim, BH Lee, H Im, SB Jeon, D Kim, ML Seol, H Hwang, YK Choi RSC Advances 6, 41914-41918, 2016 | 20 | 2016 |
| Vertically Integrated Nanowire-Based Unified Memory BH Lee, DC Aan, MH Kang, SB Jeon, YK Choi Nano Letters 16 (6), 5909-5916, 2016 | 16 | 2016 |
| Multi bit capacitorless DRAM and manufacturing method thereof YK Choi, JY Park, BH Lee US Patent 9,728,539, 2017 | 15 | 2017 |
| A mechanical and electrical transistor structure (METS) with a sub-2 nm nanogap for effective voltage scaling BH Lee, DI Moon, HJ Jang, CH Kim, ML Seol, JM Choi, DI Lee, MW Kim, ... Nanoscale 6 (14), 7799-7804, 2014 | 14 | 2014 |
| Self-powered data erasing of nanoscale flash memory by triboelectricity IK Jin, JY Park, BH Lee, SB Jeon, IW Tcho, SJ Park, WG Kim, JK Han, ... Nano Energy 52, 63-70, 2018 | 12 | 2018 |
| Ultra-Fast Erase Method of SONOS Flash Memory by Instantaneous Thermal Excitation DC Ahn, ML Seol, J Hur, DI Moon, BH Lee, JW Han, SBJ Jun-Young Park, ... IEEE Electron Device Letters 37 (2), 190 - 192, 2015 | 10 | 2015 |
| Impact of Crystalline Damage on a Vertically Integrated Junctionless Transistor DC Ahn, BH Lee, MH Kang, J Hur, T Bang, YK Choi Applied Physics Letters 109, 183108, 2016 | 8 | 2016 |
Yang-Kyu ChoiProfessor of Electrical Engineering, KAISTEmail verificata su ee.kaist.ac.kr
