| Electron microscopy image enhanced M Haider, S Uhlemann, E Schwan, H Rose, B Kabius, K Urban Nature 392 (6678), 768-769, 1998 | 1386 | 1998 |
| A spherical-aberration-corrected 200 kV transmission electron microscope M Haider, H Rose, S Uhlemann, E Schwan, B Kabius, K Urban Ultramicroscopy 75 (1), 53-60, 1998 | 599 | 1998 |
| Detection of single atoms and buried defects in three dimensions by aberration-corrected electron microscope with 0.5-Å information limit C Kisielowski, B Freitag, M Bischoff, H Van Lin, S Lazar, G Knippels, ... Microscopy and Microanalysis 14 (5), 469-477, 2008 | 396 | 2008 |
| Towards 0.1 nm resolution with the first spherically corrected transmission electron microscope M Haider, H Rose, S Uhlemann, B Kabius, K Urban Microscopy 47 (5), 395-405, 1998 | 282 | 1998 |
| Transmission electron microscopy at 20 kV for imaging and spectroscopy U Kaiser, J Biskupek, JC Meyer, J Leschner, L Lechner, H Rose, ... Ultramicroscopy 111 (8), 1239-1246, 2011 | 251 | 2011 |
| Residual wave aberrations in the first spherical aberration corrected transmission electron microscope S Uhlemann, M Haider Ultramicroscopy 72 (3-4), 109-119, 1998 | 241 | 1998 |
| Correction of the spherical aberration of a 200 kV TEM by means of a hexapole-corrector M Haider, G Braunshausen, E Schwan Optik (Stuttgart) 99 (4), 167-179, 1995 | 240 | 1995 |
| Upper limits for the residual aberrations of a high-resolution aberration-corrected STEM M Haider, S Uhlemann, J Zach Ultramicroscopy 81 (3-4), 163-175, 2000 | 230 | 2000 |
| Aberration correction in a low voltage SEM by a multipole corrector J Zach, M Haider Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 1995 | 225 | 1995 |
| First application of Cc-corrected imaging for high-resolution and energy-filtered TEM B Kabius, P Hartel, M Haider, H Müller, S Uhlemann, U Loebau, J Zach, ... Journal of electron microscopy 58 (3), 147-155, 2009 | 165 | 2009 |
| Advancing the hexapole Cs-corrector for the scanning transmission electron microscope H Müller, S Uhlemann, P Hartel, M Haider Microscopy and Microanalysis 12 (6), 442-455, 2006 | 153 | 2006 |
| Information transfer in a TEM corrected for spherical and chromatic aberration M Haider, P Hartel, H Müller, S Uhlemann, J Zach Microscopy and Microanalysis 16 (4), 393-408, 2010 | 141 | 2010 |
| Chromatic aberration correction for atomic resolution TEM imaging from 20 to 80 kV M Linck, P Hartel, S Uhlemann, F Kahl, H Müller, J Zach, M Haider, ... Physical review letters 117 (7), 076101, 2016 | 134 | 2016 |
| Prerequisites for a Cc/Cs-corrected ultrahigh-resolution TEM M Haider, H Müller, S Uhlemann, J Zach, U Loebau, R Hoeschen Ultramicroscopy 108 (3), 167-178, 2008 | 130 | 2008 |
| Thermal magnetic field noise limits resolution in transmission electron microscopy S Uhlemann, H Müller, P Hartel, J Zach, M Haider Physical review letters 111 (4), 046101, 2013 | 117 | 2013 |
| Current and future aberration correctors for the improvement of resolution in electron microscopy M Haider, P Hartel, H Müller, S Uhlemann, J Zach Philosophical Transactions of the Royal Society A: Mathematical, Physical …, 2009 | 106 | 2009 |
| Correction of spherical and chromatic aberration in a low voltage SEM J Zach, M Haider Optik (Stuttgart) 98 (3), 112-118, 1995 | 103 | 1995 |
| Aberration corrected 1.2-MV cold field-emission transmission electron microscope with a sub-50-pm resolution T Akashi, Y Takahashi, T Tanigaki, T Shimakura, T Kawasaki, T Furutsu, ... Applied Physics Letters 106 (7), 2015 | 102 | 2015 |
| Concentration evaluation of chromatin in unstained resin-embedded sections by means of low-dose ratio-contrast imaging in STEM B Bohrmann, M Haider, E Kellenberger Ultramicroscopy 49 (1-4), 235-251, 1993 | 85 | 1993 |
| Probing the Out-of-Plane Distortion of Single Point Defects in Atomically<? format?> Thin Hexagonal Boron Nitride at the Picometer Scale N Alem, OV Yazyev, C Kisielowski, P Denes, U Dahmen, P Hartel, ... Physical review letters 106 (12), 126102, 2011 | 84 | 2011 |