Segui
Ken Suzuki
Ken Suzuki
Email verificata su tohoku.ac.jp
Titolo
Citata da
Citata da
Anno
The effect of chemical composition and heat treatment conditions on stacking fault energy for Fe-Cr-Ni austenitic stainless steel
T Yonezawa, K Suzuki, S Ooki, A Hashimoto
Metallurgical and Materials Transactions A 44, 5884-5896, 2013
1352013
Intramolecular Cyclization of 2,7- or 2,8-Bis-unsaturated Esters Mediated by (η2-Propene)Ti(O-i-Pr)2. Facile Construction of Mono- and Bicyclic Skeletons with …
H Urabe, K Suzuki, F Sato
Journal of the American Chemical Society 119 (42), 10014-10027, 1997
1261997
Lewis Acid-Enhanced Reactivity of. alpha.,. beta.-Unsaturated Esters and Amides toward Radical Addition
H Urabe, K Yamashita, K Suzuki, K Kobayashi, F Sato
The Journal of Organic Chemistry 60 (12), 3576-3577, 1995
1161995
Early stage SCC initiation analysis of fcc Fe–Cr–Ni ternary alloy at 288 C: A quantum chemical molecular dynamics approach
NK Das, K Suzuki, K Ogawa, T Shoji
Corrosion Science 51 (4), 908-913, 2009
902009
A Novel Tandem Cyclization of 2,7- or 2,8-Bis-Unsaturated Esters Mediated by (η2-Propene)TiX2 (X = Cl or O-i-Pr). A Facile Construction of Bicyclo[3.3.0]octane …
K Suzuki, H Urabe, F Sato
Journal of the American Chemical Society 118 (36), 8729-8730, 1996
761996
Molecular dynamics simulation of enhanced oxygen ion diffusion in strained yttria-stabilized zirconia
K Suzuki, M Kubo, Y Oumi, R Miura, H Takaba, A Fahmi, A Chatterjee, ...
Applied physics letters 73 (11), 1502-1504, 1998
721998
Quantum chemical molecular dynamics study of stress corrosion cracking behavior for fcc Fe and Fe–Cr surfaces
NK Das, K Suzuki, Y Takeda, K Ogawa, T Shoji
Corrosion Science 50 (6), 1701-1706, 2008
642008
Synthesis of CoMoO4@ RGO nanocomposites as high-performance supercapacitor electrodes
L Jinlong, Y Meng, K Suzuki, H Miura
Microporous and Mesoporous Materials 242, 264-270, 2017
502017
Performance comparison of NiCo2O4 and NiCo2S4 formed on Ni foam for supercapacitor
L Jinlong, L Tongxiang, Y Meng, S Ken, M Hideo
Composites Part B: Engineering 123, 28-33, 2017
482017
Materials design of perovskite-based oxygen ion conductor by molecular dynamics method
Y Yamamura, C Ihara, S Kawasaki, H Sakai, K Suzuki, S Takami, M Kubo, ...
Solid State Ionics 160 (1-2), 93-101, 2003
412003
Computational chemistry study on the dynamics of lubricant molecules under shear conditions
D Kamei, H Zhou, K Suzuki, K Konno, S Takami, M Kubo, A Miyamoto
Tribology International 36 (4-6), 297-303, 2003
412003
Effect of crystallographic quality of grain boundaries on both mechanical and electrical properties of electroplated copper thin film interconnections
N Murata, N Saito, K Tamakawa, K Suzuki, H Miura
Journal of Electronic Packaging 137 (3), 031001, 2015
392015
Structural properties of LixMn2O4 as investigated by molecular dynamics and density functional theory
K Suzuki, Y Oumi, S Takami, M Kubo, A Miyamoto, M Kikuchi, N Yamazaki, ...
Japanese Journal of Applied Physics 39 (7S), 4318, 2000
392000
Electronic properties and strain sensitivity of CVD-grown graphene with acetylene
M Yang, S Sasaki, M Ohnishi, K Suzuki, H Miura
Japanese Journal of Applied Physics 55 (4S), 04EP05, 2016
382016
Fatigue strength of electroplated copper thin films under uni-axial stress
N Murata, K Tamakawa, K Suzuki, H Miura
Journal of Solid Mechanics and Materials Engineering 3 (3), 498-506, 2009
372009
Fluctuation mechanism of mechanical properties of electroplated-copper thin films used for three dimensional electronic modules
H Miura, K Suzuki, K Tamakawa
2007 International Conference on Thermal, Mechanical and Multi-Physics …, 2007
352007
Fabrication of 3D graphene foam for a highly conducting electrode
L Jinlong, Y Meng, K Suzuki, H Miura
Materials Letters 196, 369-372, 2017
342017
Microscopic analysis of the initiation of high-temperature damage of Ni-Based heat-resistant alloy
T Murakoshi, K Suzuki, I Nonaka, H Miura
ASME International Mechanical Engineering Congress and Exposition 50633 …, 2016
332016
Improvement of crystallographic quality of electroplated copper thin-film interconnections for through-silicon vias
K Suzuki, N Murata, N Saito, R Furuya, O Asai, H Miura
Japanese Journal of Applied Physics 52 (4S), 04CB01, 2013
332013
Effect of the crystallinity on the electromigration resistance of electroplated copper thin-film interconnections
T Kato, K Suzuki, H Miura
Journal of Electronic Packaging 139 (2), 020911, 2017
322017
Il sistema al momento non può eseguire l'operazione. Riprova più tardi.
Articoli 1–20