| Evaluation of a soft error tolerance technique based on time and/or space redundancy L Anghel, D Alexandrescu, M Nicolaidis Proceedings 13th Symposium on Integrated Circuits and Systems Design (Cat …, 2000 | 166 | 2000 |
| Low-cost highly-robust hardened cells using blocking feedback transistors M Nicolaidis, R Perez, D Alexandrescu 26th IEEE VLSI Test Symposium (vts 2008), 371-376, 2008 | 109 | 2008 |
| New methods for evaluating the impact of single event transients in VDSM ICs D Alexandrescu, L Anghel, M Nicolaidis 17th IEEE International Symposium on Defect and Fault Tolerance in VLSI …, 2002 | 95 | 2002 |
| Comprehensive analysis of sequential and combinational soft errors in an embedded processor M Ebrahimi, A Evans, MB Tahoori, E Costenaro, D Alexandrescu, ... IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2015 | 71 | 2015 |
| Comprehensive analysis of alpha and neutron particle-induced soft errors in an embedded processor at nanoscales M Ebrahimi, A Evans, MB Tahoori, R Seyyedi, E Costenaro, ... 2014 Design, Automation & Test in Europe Conference & Exhibition (DATE), 1-6, 2014 | 63 | 2014 |
| Study of neutron soft error rate (SER) sensitivity: Investigation of upset mechanisms by comparative simulation of FinFET and planar MOSFET SRAMs J Noh, V Correas, S Lee, J Jeon, I Nofal, J Cerba, H Belhaddad, ... IEEE Transactions on Nuclear Science 62 (4), 1642-1649, 2015 | 61 | 2015 |
| New techniques for SET sensitivity and propagation measurement in flash-based FPGAs A Evans, D Alexandrescu, V Ferlet-Cavrois, M Nicolaidis IEEE Transactions on Nuclear Science 61 (6), 3171-3177, 2014 | 46 | 2014 |
| Design for soft error resiliency in internet core routers AL Silburt, A Evans, I Perryman, SJ Wen, D Alexandrescu IEEE Transactions on Nuclear Science 56 (6), 3551-3555, 2009 | 45 | 2009 |
| Simulating single event transients in VDSM ICs for ground level radiation D Alexandrescu, L Anghel, M Nicolaidis Journal of Electronic Testing 20, 413-421, 2004 | 41 | 2004 |
| Detailed SET measurement and characterization of a 65 nm bulk technology M Glorieux, A Evans, V Ferlet-Cavrois, C Boatella-Polo, D Alexandrescu, ... IEEE Transactions on Nuclear Science 64 (1), 81-88, 2016 | 39 | 2016 |
| A practical approach to single event transients analysis for highly complex designs D Alexandrescu, E Costenaro, M Nicolaidis 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2011 | 36 | 2011 |
| Single event multiple transient (SEMT) measurements in 65 nm bulk technology A Evans, M Glorieux, D Alexandrescu, CB Polo, V Ferlet-Cavrois 2016 16th European Conference on Radiation and Its Effects on Components and …, 2016 | 32 | 2016 |
| A practical approach to single event transient analysis for highly complex design E Costenaro, D Alexandrescu, K Belhaddad, M Nicolaidis Journal of Electronic Testing 29, 301-315, 2013 | 31 | 2013 |
| A comprehensive soft error analysis methodology for SoCs/ASICs memory instances D Alexandrescu 2011 IEEE 17th International On-Line Testing Symposium, 175-176, 2011 | 31 | 2011 |
| Hierarchical RTL-based combinatorial SER estimation A Evans, D Alexandrescu, E Costenaro, L Chen 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), 139-144, 2013 | 28 | 2013 |
| Cardiac tumors AO Petris, DM Alexandrescu, II Costache The Medical-Surgical Journal 118 (2), 289-292, 2014 | 25 | 2014 |
| Single-Event Characterization of Xilinx UltraScale+® MPSOC under Standard and Ultra-High Energy Heavy-Ion Irradiation M Glorieux, A Evans, T Lange, AD In, D Alexandrescu, C Boatella-Polo, ... 2018 IEEE Radiation Effects Data Workshop (REDW), 1-5, 2018 | 24 | 2018 |
| Riif-reliability information interchange format A Evans, M Nicolaidis, SJ Wen, D Alexandrescu, E Costenaro 2012 IEEE 18th International On-Line Testing Symposium (IOLTS), 103-108, 2012 | 23 | 2012 |
| Towards optimized functional evaluation of SEE-induced failures in complex designs D Alexandrescu, E Costenaro 2012 IEEE 18th International On-Line Testing Symposium (IOLTS), 182-187, 2012 | 21 | 2012 |
| A systematical method of quantifying SEU FIT SJ Wen, D Alexandrescu, R Perez 2008 14th IEEE International On-Line Testing Symposium, 109-114, 2008 | 21 | 2008 |
