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- Mike KramesArkesso, LLC; ORCID 0000-0001-8545-851XEmail verificata su arkesso.com
- Daniel KoleskeTechnical Staff, Sandia National LaboratoriesEmail verificata su sandia.gov
- Jeff TsaoSandia National LaboratoriesEmail verificata su sandia.gov
- A. A. AllermanSandia National LaboratoriesEmail verificata su sandia.gov
- George T. WangSandia National LaboratoriesEmail verificata su sandia.gov
- Nelson TansuHead of School & Professor, School of Electrical & Mechanical Engineering [EEE, ME, & BME]Email verificata su adelaide.edu.au
- Mihail SigalasProfessor, Department of Materials Science, University of PatrasEmail verificata su upatras.gr
- Renbo SongLehigh UniversityEmail verificata su lehigh.edu
- Fred KishProfessor of ECE, North Carolina State UniversityEmail verificata su ncsu.edu
- Wei SunCoherent Corp.Email verificata su coherent.com
- Aurelien DavidGoogleEmail verificata su polytechnique.org
- Andrew Y. KimLumiledsEmail verificata su alum.mit.edu
- Syed Ahmed Al MuyeedGoogleEmail verificata su alum.lehigh.edu
- Xiongliang WeiR&D Engineer, Hisense photonicsEmail verificata su hisensebroadband.com
- Damir BorovacLehigh UniversityEmail verificata su lehigh.edu
- Matthew PeartMagneton Inc.Email verificata su magneton.net
- Alexander NeumannPostdoc at University of New MexicoEmail verificata su chtm.unm.edu
- Haotian XueNorth Carolina State UniversityEmail verificata su ncsu.edu
- Lincoln J LauhonNorthwestern UniversityEmail verificata su northwestern.edu
- Elia PalmeseUniversity of DelawareEmail verificata su udel.edu
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Jonathan J. Wierer, Jr.
North Carolina State University, Department of Electrical and Computer Engineering
Email verificata su ncsu.edu - Home page