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Vincent Meyers
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Quantum wells and the generalized uncertainty principle
G Blado, C Owens, V Meyers
European Journal of Physics 35 (6), 065011, 2014
362014
p-type conductivity and damage recovery in implanted GaN annealed by rapid gyrotron microwave annealing
V Meyers, E Rocco, TJ Anderson, JC Gallagher, MA Ebrish, K Jones, ...
Journal of Applied Physics 128 (8), 2020
232020
Hillock assisted p-type enhancement in N-polar GaN: Mg films grown by MOCVD
E Rocco, O Licata, I Mahaboob, K Hogan, S Tozier, V Meyers, B McEwen, ...
Scientific Reports 10 (1), 1426, 2020
232020
MOCVD Growth and Characterization of Be-Doped GaN
B McEwen, MA Reshchikov, E Rocco, V Meyers, K Hogan, O Andrieiev, ...
ACS Applied Electronic Materials 4 (8), 3780-3785, 2022
132022
Evaluation of GaN: Fe as a high voltage photoconductive semiconductor switch for pulsed power applications
D Mauch, J Dickens, V Kuryatkov, V Meyers, R Ness, S Nikishin, ...
2015 IEEE Pulsed Power Conference (PPC), 1-4, 2015
122015
Thermal annealing of GaN implanted with Be
MA Reshchikov, O Andrieiev, M Vorobiov, D Ye, DO Demchenko, ...
Journal of Applied Physics 131 (12), 2022
102022
P-type conductivity and suppression of green luminescence in Mg/N co-implanted GaN by gyrotron microwave annealing
V Meyers, E Rocco, K Hogan, B McEwen, M Shevelev, V Sklyar, K Jones, ...
Journal of Applied Physics 130 (8), 2021
102021
Toward the development of an efficient bulk semi-insulating GaN photoconductive switch
V Meyers, D Mauch, V Kuryatkov, S Nikishin, J Dickens, A Neuber, ...
2017 IEEE 21st International Conference on Pulsed Power (PPC), 1-4, 2017
102017
Characterization of the optical properties of GaN: Fe for high voltage photoconductive switch applications
V Meyers, D Mauch, J Mankowski, J Dickens, A Neuber
2015 IEEE Pulsed Power Conference (PPC), 1-4, 2015
92015
Photoluminescence from Be‐Doped GaN Grown by Metal‐Organic Chemical Vapor Deposition
MA Reshchikov, M Vorobiov, O Andrieiev, B McEwen, E Rocco, V Meyers, ...
physica status solidi (b) 260 (8), 2200487, 2023
72023
Removal of Dry-Etch-Induced Surface Layer Damage from p-GaN by Photoelectrochemical Etching
V Meyers, E Rocco, K Hogan, S Tozier, B McEwen, I Mahaboob, ...
Journal of Electronic Materials 49, 3481-3489, 2020
72020
Nonlinear UV absorption properties of bulk 4H-SiC
V Meyers, D Mauch, J Dickens, A Neuber
Journal of Applied Physics 121 (11), 2017
72017
Investigation of the Effects of Forming Gas Annealing on Al2O3/GaN Interface
B McEwen, I Mahaboob, E Rocco, K Hogan, V Meyers, R Green, ...
Journal of Electronic Materials 50, 80-84, 2021
62021
Laser ablation on lithium-ion battery electrode solid electrolyte interface removal
Y Zhang, Y Zhang, Z Liu, D Guan, F Wang, V Meyers, C Yuan, A Neuber, ...
Journal of Laser Applications 29 (4), 2017
62017
Impurity incorporation and diffusion from regrowth interfaces in N-polar GaN photocathodes and the impact on quantum efficiency
E Rocco, I Mahaboob, K Hogan, V Meyers, B McEwen, LD Bell, ...
Journal of Applied Physics 129 (19), 2021
52021
Defect-mediated diffusion of implanted Mg in GaN: Suppressing dopant redistribution by sequential thermal and microwave annealing
V Meyers, E Rocco, B McEwen, M Shevelev, V Sklyar, ...
Journal of Applied Physics 133 (15), 2023
32023
In operando investigation of GaN PIN device characteristics under electron irradiation energies comparable to Pm-147 source for betavoltaic application
K Hogan, M Rodriguez, E Rocco, V Meyers, B McEwen, ...
AIP Advances 10 (8), 2020
32020
Novel gyrotron beam annealing method for Mg-implanted bulk GaN
K Hogan, S Tozier, E Rocco, I Mahaboob, V Meyers, B McEwen, ...
2019 IEEE International Reliability Physics Symposium (IRPS), 1-6, 2019
32019
Structural, morphological, optical and electrical properties of bulk (0001) GaN: Fe Wafers
M Gaddy, V Kuryatkov, V Meyers, D Mauch, J Dickens, A Neuber, ...
MRS Advances 3, 179-184, 2018
32018
Pulsed characterization of a UV LED for pulsed power applications on a silicon carbide photoconductive semiconductor switch
N Wilson, D Mauch, V Meyers, S Feathers, J Dickens, A Neuber
Review of Scientific Instruments 88 (8), 2017
32017
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Articoli 1–20