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- Minoru Fujii (藤井 稔)Department of Electrical and Electronic Engineering, Graduate School of Engineering, Kobe UniversityEmail verificata su eedept.kobe-u.ac.jp
- Tatsuki HinamotoDepartment of Electrical and Electronic Engineering, Kobe UniversityEmail verificata su stu.kobe-u.ac.jp
- Shinji HAYASHIGraduate School of Engineering, Kobe UniversityEmail verificata su dragon.kobe-u.ac.jp
- Shinya KanoNational Institute of Advanced Industrial Science and Technology (AIST)Email verificata su eedept.kobe-u.ac.jp
- Takashi KannoPanasonic Corp.Email verificata su jp.panasonic.com
- Asuka InoueNTT Device Technology LaboratoriesEmail verificata su hco.ntt.co.jp
- Søren RazaAssociate Professor, Technical University of DenmarkEmail verificata su dtu.dk
- Anna FucikovaMFF UK, FZU AVČR, VSCHT, past KTH ICTEmail verificata su mff.cuni.cz
- Luca Dal NegroProfessor of Electrical and Computer Engineering, Boston UniversityEmail verificata su bu.edu
- Jan ValentaCharles UniversityEmail verificata su mff.cuni.cz
- Marie Hubalek KalbacovaInstitute of Pathological Physiology, 1st Faculty of Medicine, Charles UniversityEmail verificata su lf1.cuni.cz
- Bjoern M. ReinhardBoston UniversityEmail verificata su bu.edu
- Yusuke HoriDepartment of Electrical and Electronic Engineering, Graduate School of Engineering, Kobe UniversityEmail verificata su stu.kobe-u.ac.jp
- Antonio CaprettiSurflyEmail verificata su uva.nl
- Yu WangApple Inc, Boston UniversityEmail verificata su apple.com
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Hiroshi Sugimoto
Associate Professor at Department of Electrical and Electronic Engineering, Kobe University
Email verificata su eedept.kobe-u.ac.jp - Home page