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- Gadi EisensteinTechnion - Israel Institute of TechnologyEmail verificata su technion.ac.il
- Tony F HeinzDepts. of Applied Physics, Photon Science, and, by courtesy, of Electrical Eng., SLAC, StanfordEmail verificata su stanford.edu
- Johann Peter ReithmaierInstitute of Nanostructure Technologies and Analytics (INA), University of KasselEmail verificata su ina.uni-kassel.de
- Amir CapuaAssistant Professor, Hebrew UniversityEmail verificata su mail.huji.ac.il
- Elyse BarréLawrence Berkeley National LaboratoryEmail verificata su lbl.gov
- Bumho KimUniversity of PennsylvaniaEmail verificata su sas.upenn.edu
- Henrique Bucker RibeiroSenior research scientist at Corning Inc.Email verificata su corning.com
- Felipe H. da JornadaDepartment of Materials Science and Engineering, Stanford UniversityEmail verificata su stanford.edu
- Akhilesh Kumar MishraIndian Institute of Technology Roorkee, IndiaEmail verificata su ph.iitr.ac.in
- Eric Yue MaAssistant Professor of Physics & EECS, UC BerkeleyEmail verificata su berkeley.edu
- Sze Cheung LauStanford UniversityEmail verificata su stanford.edu
- T.TaniguchiNational Institute for Materials ScienceEmail verificata su nims.go.jp
- Kenji WatanabeNational Institute for Materials ScienceEmail verificata su nims.go.jp
- Vitalii SichkovskyiInstitute of Nanostructure Technologies and Analytics, University of KasselEmail verificata su uni-kassel.de
- Emma C. ReganEmail verificata su berkeley.edu
- Chenhao JinUC Santa BarbaraEmail verificata su ucsb.edu
- Feng WangUC Berkeley and LBNLEmail verificata su berkeley.edu
- Ralph H. PageUniversity of California at BerkeleyEmail verificata su stanford.edu
- Roland GillenSwansea UniversityEmail verificata su swansea.ac.uk
- Janina MaultzschFriedrich-Alexander-Universität Erlangen-Nürnberg (FAU)Email verificata su fau.de