| Electron spin decoherence in isotope-enriched silicon WM Witzel, MS Carroll, A Morello, Ł Cywiński, S Das Sarma Physical review letters 105 (18), 187602, 2010 | 229 | 2010 |
| Semiconductor devices with reduced active region defects and unique contacting schemes JD Bude, M Carroll, CA King US Patent 7,012,314, 2006 | 188 | 2006 |
| High-fidelity single-shot readout for a spin qubit via an enhanced latching mechanism P Harvey-Collard, B D’Anjou, M Rudolph, NT Jacobson, J Dominguez, ... Physical Review X 8 (2), 021046, 2018 | 143 | 2018 |
| A silicon metal-oxide-semiconductor electron spin-orbit qubit RM Jock, NT Jacobson, P Harvey-Collard, AM Mounce, V Srinivasa, ... Nature communications 9 (1), 1768, 2018 | 129 | 2018 |
| Observation of percolation-induced two-dimensional metal-insulator transition in a Si MOSFET LA Tracy, EH Hwang, K Eng, GA Ten Eyck, EP Nordberg, K Childs, ... Physical Review B—Condensed Matter and Materials Physics 79 (23), 235307, 2009 | 122 | 2009 |
| Quantum decoherence of the central spin in a sparse system of dipolar coupled spins WM Witzel, MS Carroll, Ł Cywiński, S Das Sarma Physical Review B—Condensed Matter and Materials Physics 86 (3), 035452, 2012 | 118 | 2012 |
| Coherent coupling between a quantum dot and a donor in silicon P Harvey-Collard, NT Jacobson, M Rudolph, J Dominguez, GA Ten Eyck, ... Nature communications 8 (1), 1029, 2017 | 115* | 2017 |
| Enhancement-mode double-top-gated metal-oxide-semiconductor nanostructures with tunable lateral geometry EP Nordberg, GAT Eyck, HL Stalford, RP Muller, RW Young, K Eng, ... Physical Review B—Condensed Matter and Materials Physics 80 (11), 115331, 2009 | 103 | 2009 |
| Semiconductor devices with reduced active region defects and unique contacting schemes JD Bude, M Carroll, CA King US Patent 7,297,569, 2007 | 99 | 2007 |
| Dynamics of superconducting qubit relaxation times M Carroll, S Rosenblatt, P Jurcevic, I Lauer, A Kandala npj Quantum Information 8 (1), 132, 2022 | 83 | 2022 |
| Valley splitting of single-electron Si MOS quantum dots JK Gamble, P Harvey-Collard, NT Jacobson, AD Baczewski, E Nielsen, ... Applied Physics Letters 109 (25), 2016 | 79 | 2016 |
| Single shot spin readout using a cryogenic high-electron-mobility transistor amplifier at sub-Kelvin temperatures LA Tracy, DR Luhman, SM Carr, NC Bishop, GA Ten Eyck, T Pluym, ... Applied Physics Letters 108 (6), 2016 | 70 | 2016 |
| 25-nm p-channel vertical MOSFETs with SiGeC source-drains M Yang, CL Chang, M Carroll, JC Sturm IEEE Electron Device Letters 20 (6), 301-303, 1999 | 66 | 1999 |
| Spin-orbit interactions for singlet-triplet qubits in silicon P Harvey-Collard, NT Jacobson, C Bureau-Oxton, RM Jock, V Srinivasa, ... Physical review letters 122 (21), 217702, 2019 | 64 | 2019 |
| Accurate modelling of average phosphorus diffusivities in germanium after long thermal anneals: evidence of implant damage enhanced diffusivities MS Carroll, R Koudelka Semiconductor science and technology 22 (1), S164, 2006 | 63 | 2006 |
| Ion implantation for deterministic single atom devices JL Pacheco, M Singh, DL Perry, JR Wendt, G Ten Eyck, RP Manginell, ... Review of Scientific Instruments 88 (12), 2017 | 61 | 2017 |
| Cryogenic preamplification of a single-electron-transistor using a silicon-germanium heterojunction-bipolar-transistor MJ Curry, TD England, NC Bishop, G Ten-Eyck, JR Wendt, T Pluym, ... Applied Physics Letters 106 (20), 2015 | 61 | 2015 |
| Quantum computer aided design simulation and optimization of semiconductor quantum dots X Gao, E Nielsen, RP Muller, RW Young, AG Salinger, NC Bishop, ... Journal of Applied Physics 114 (16), 2013 | 61 | 2013 |
| Efficient clocked electron transfer on superfluid helium FR Bradbury, M Takita, TM Gurrieri, KJ Wilkel, K Eng, MS Carroll, SA Lyon Physical review letters 107 (26), 266803, 2011 | 56 | 2011 |
| Implications of simultaneous requirements for low-noise exchange gates in double quantum dots E Nielsen, RW Young, RP Muller, MS Carroll Physical Review B—Condensed Matter and Materials Physics 82 (7), 075319, 2010 | 56 | 2010 |
Rick MullerSandia National LaboratoriesEmail verificata su sandia.gov