A novel Love-mode device based on a ZnO/ST-cut quartz crystal structure for sensing applications KK Zadeh, A Trinchi, W Wlodarski, A Holland
Sensors and Actuators A: Physical 100 (2-3), 135-143, 2002
114 2002 Reactive ion etching of diamond in CF4, O2, O2 and Ar-based mixtures PW Leech, GK Reeves, A Holland
Journal of materials science 36, 3453-3459, 2001
95 2001 In situ micro-Raman analysis and X-ray diffraction of nickel silicide thin films on silicon M Bhaskaran, S Sriram, TS Perova, V Ermakov, GJ Thorogood, KT Short, ...
Micron 40 (1), 89-93, 2009
58 2009 Electronically tunable lumped element 90 E Fardin, A Holland, K Ghorbani
Electron. Lett. 42 (6), 353-355, 2006
55 2006 Enhanced tunability of magnetron sputtered Ba0. 5Sr0. 5TiO3 thin films on c-plane sapphire substrates EA Fardin, AS Holland, K Ghorbani, P Reichart
Applied Physics Letters 89 (2), 2006
50 2006 Thermoelectric properties of bismuth telluride thin films deposited by radio frequency magnetron sputtering J Tan, K Kalantar-Zadeh, W Wlodarski, S Bhargava, D Akolekar, ...
Smart Sensors, Actuators, and MEMS II 5836, 711-718, 2005
47 2005 Ion beam etching of CVD diamond film in Ar, Ar/O2 and Ar/CF4 gas mixtures PW Leech, GK Reeves, AS Holland, F Shanks
Diamond and related materials 11 (3-6), 833-836, 2002
40 2002 Electrical characterization and hydrogen gas sensing properties of a n-ZnO∕ p-SiC Pt-gate metal semiconductor field effect transistor S Kandasamy, W Wlodarski, A Holland, S Nakagomi, Y Kokubun
Applied physics letters 90 (6), 2007
37 2007 Measurement of high piezoelectric response of strontium-doped lead zirconate titanate thin films using a nanoindenter S Sriram, M Bhaskaran, AS Holland, KT Short, BA Latella
Journal of applied physics 101 (10), 2007
36 2007 Polycrystalline Ba0. 6Sr0. 4TiO3 thin films on r-plane sapphire: Effect of film thickness on strain and dielectric properties EA Fardin, AS Holland, K Ghorbani, EK Akdogan, WK Simon, A Safari, ...
Applied physics letters 89 (18), 2006
35 2006 The effect of post-deposition cooling rate on the orientation of piezoelectric (Pb0. 92Sr0. 08)(Zr0. 65Ti0. 35) O3 thin films deposited by RF magnetron sputtering S Sriram, M Bhaskaran, AS Holland
Semiconductor science and technology 21 (9), 1236, 2006
35 2006 Poly (caprolactone) thin film preparation, morphology, and surface texture D Simon, A Holland, R Shanks
Journal of applied polymer science 103 (2), 1287-1294, 2007
32 2007 SAW-based gas sensors with rf sputtered InOx and PECVD SiNx films: Response to H2 and O3 gases AC Fechete, W Wlodarski, K Kalantar-Zadeh, AS Holland, J Antoszewski, ...
Sensors and Actuators B: Chemical 118 (1-2), 362-367, 2006
31 2006 Characterization of C54 titanium silicide thin films by spectroscopy, microscopy and diffraction M Bhaskaran, S Sriram, KT Short, DRG Mitchell, AS Holland, GK Reeves
Journal of Physics D: Applied Physics 40 (17), 5213, 2007
30 2007 Comparison between conductometric and layered surface acoustic wave hydrogen gas sensors SJ Ippolito, S Kandasamy, K Kalantar-Zadeh, W Wlodarski, A Holland
Smart materials and structures 15 (1), S131, 2005
30 2005 A varactor tuned branch-line hybrid coupler EA Fardin, K Ghorbani, AS Holland
2005 Asia-Pacific Microwave Conference Proceedings 3, 4 pp., 2005
29 2005 Universal error corrections for finite semiconductor resistivity in cross-Kelvin resistor test structures AS Holland, GK Reeves, PW Leech
IEEE Transactions on Electron Devices 51 (6), 914-919, 2004
27 2004 Rectifying electrical contacts to n-type 6H–SiC formed from energetically deposited carbon M Kracica, ELH Mayes, HN Tran, AS Holland, DG McCulloch, ...
Carbon 102, 141-144, 2016
22 2016 Analytical and finite-element modeling of a two-contact circular test structure for specific contact resistivity Y Pan, GK Reeves, PW Leech, AS Holland
IEEE transactions on electron devices 60 (3), 1202-1207, 2013
20 2013 A novel love mode device with nanocrystalline ZnO film for gas sensing applications K Kalantar-Zadeh, A Trinchi, W Wlodarski, A Holland, MZ Atashbar
Proceedings of the 2001 1st IEEE Conference on Nanotechnology. IEEE-NANO …, 2001
20 2001