| A Physics-Based Statistical RTN Model for the Low Frequency Noise in MOSFETs M Banaszeski da Silva, HP Tuinhout, A Zegers-van Duijnhoven, GI Wirth, ... IEEE Transactions on Electron Devices 63 (9), 3683-3692, 2016 | 37 | 2016 |
| A physics-based RTN variability model for MOSFETs M Banaszeski da Silva, H Tuinhout, A Zegers-van Duijnhoven, GI Wirth, ... Electron Devices Meeting (IEDM), 2014 IEEE International, 35.2. 1-35.2. 4, 2014 | 26* | 2014 |
| On-chip circuit for massively parallel BTI characterization MB da Silva, B Kaczer, G Van der Plas, GI Wirth, G Groeseneken 2011 IEEE International Integrated Reliability Workshop Final Report, 90-93, 2011 | 11 | 2011 |
| Autocorrelation Analysis as a Technique to Study Physical Mechanisms of MOSFET Low-Frequency Noise TH Both, JA Croon, M Banaszeski da Silva, HP Tuinhout, AJ Scholten, ... IEEE Transactions on Electron Devices, 2017 | 10 | 2017 |
| NBTI-aware technique for transistor sizing of high-performance CMOS gates M B da Silva, VVA Camargo, L Brusamarello, GI Wirth, R da Silva Test Workshop, 2009. LATW'09. 10th Latin American, 1-5, 2009 | 10 | 2009 |
| Random telegraph noise modeling for circuit analysis: RTN in ring oscillators MB da Silva, TH Both, GI Wirth IEEE Journal of the Electron Devices Society 10, 459-465, 2022 | 7 | 2022 |
| Unified compact modeling of charge trapping in 1/f noise, RTN and BTI G Wirth, MB da Silva, TH Both 2021 5th IEEE Electron Devices Technology & Manufacturing Conference (EDTM), 1-3, 2021 | 5 | 2021 |
| A compact statistical model for the low-frequency noise in halo-implanted MOSFETs: Large RTN induced by halo implants MB da Silva, TH Both, HP Tuinhout, A Zegers-van Duijnhoven, GI Wirth, ... IEEE Transactions on Electron Devices 66 (8), 3521-3526, 2019 | 5 | 2019 |
| Random telegraph noise in analog CMOS circuits MB da Silva, GI Wirth, HP Tuinhout, A Zegers-van Duijnhoven, ... IEEE Transactions on Circuits and Systems I: Regular Papers 70 (6), 2229-2242, 2023 | 4 | 2023 |
| A Compact Model for the Statistics of the Low-Frequency Noise of MOSFETs With Laterally Uniform Doping M Banaszeski da Silva, HP Tuinhout, A Zegers-van Duijnhoven, GI Wirth, ... IEEE Transactions on Electron Devices, 2017 | 4 | 2017 |
| Towards unifying the statistical modeling of charge trapping in time and frequency domain G Wirth, MB da Silva, TH Both 2021 IEEE Latin America Electron Devices Conference (LAEDC), 1-3, 2021 | 3 | 2021 |
| A physics-based statistical random telegraph noise model M Banaszeski da Silva | 2 | 2016 |
| Modeling the impact of RTS on the reliability of ring oscillators M Banaszeski da Silva, G Wirth Proceedings of the 23rd symposium on Integrated circuits and system design …, 2010 | 2 | 2010 |
| An overview on statistical modeling of random telegraph noise in the frequency domain TH Both, MB da Silva, GI Wirth, HP Tuinhout, AZ Duijnhoven, JA Croon, ... Noise in Nanoscale Semiconductor Devices, 495-516, 2020 | 1 | 2020 |
| A variability-based analysis technique revealing physical mechanisms of MOSFET low-frequency noise TH Both, JA Croon, M Banaszeski da Silva, HP Tuinhout, ... Microelectronic Test Structures (ICMTS), 2017 International Conference of, 1-5, 2017 | 1 | 2017 |
| Modeling and Predicting Noise-Induced Failure Rates in Ultra-Low-Voltage SRAM Bitcells Affected by Process Variations L Van Brandt, M Bonnin, MB da Silva, P Bolcato, GI Wirth, D Flandre, ... IEEE Transactions on Circuits and Systems I: Regular Papers, 2025 | | 2025 |
| A Novel Approach to Measure the Chip Formation Temperature Using the Implanted Thermocouple Method CPP Silva, TCC Oliveira, RG Lisboa, MB Da Silva, AM Abrão, ... Experimental Techniques 48 (6), 1093-1100, 2024 | | 2024 |
| Circuito on-chip para a caracterização em alta escala do efeito de Bias Temperature Instability MB Silva | | 2016 |
| Tribological analysis of influence of coolant concentration during grinding a mould steel grade RB Da Silva, RL De Paiva, C Guimaraes, MB Da Silva, ES Costa, ... | | 2014 |
| Ruído RTS em osciladores em anel MB Silva | | 2009 |
