| Probe characterization for electromagnetic near-field studies S Jarrix, T Dubois, R Adam, P Nouvel, B Azais, D Gasquet IEEE Transactions on Instrumentation and Measurement 59 (2), 292-300, 2009 | 69 | 2009 |
| Near-field electromagnetic characterization and perturbation of logic circuits T Dubois, S Jarrix, A Penarier, P Nouvel, D Gasquet, L Chusseau, B Azais IEEE Transactions on Instrumentation and Measurement 57 (11), 2398-2404, 2008 | 69 | 2008 |
| Effect of low and high power continuous wave electromagnetic interference on a microwave oscillator system: From VCO to PLL to QPSK receiver T Dubois, JJ Laurin, J Raoult, S Jarrix IEEE Transactions on electromagnetic compatibility 56 (2), 286-293, 2013 | 31 | 2013 |
| Immunity measurement and modeling of an ADC embedded in a microcontroller using RFIP technique A Ayed, T Dubois, JL Levant, G Duchamp IEEE Transactions on Electromagnetic Compatibility 57 (5), 955-962, 2015 | 16 | 2015 |
| Characterization and model of temperature effect on the conducted immunity of Op-Amp T Dubois, S Hairoud, MHG de Oliveira, H Frémont, G Duchamp Microelectronics Reliability 55 (9-10), 2055-2060, 2015 | 15 | 2015 |
| Comparison of voltages induced in an electronic equipment during far field and near field normative radiated immunity tests A Durier, SB Dhia, T Dubois 2019 International Symposium on Electromagnetic Compatibility-EMC EUROPE …, 2019 | 14 | 2019 |
| Conducted immunity of three op-amps using the dpi measurement technique and vhdl-ams modeling S Hairoud, T Dubois, A Tetelin, G Duchamp 2013 9th International Workshop on Electromagnetic Compatibility of …, 2013 | 13 | 2013 |
| Effects of process-voltage-temperature (PVT) variations on low-side MOSFET circuit conducted emission N Baptistat, K Abouda, G Duchamp, T Dubois 2019 12th International Workshop on the Electromagnetic Compatibility of …, 2019 | 11 | 2019 |
| Effects of HPEM stress on GaAs low-noise amplifier from circuit to component scale M Girard, T Dubois, P Hoffmann, G Duchamp Microelectronics Reliability 88, 914-919, 2018 | 11 | 2018 |
| Étude de l'effet d'ondes électromagnétiques sur le fonctionnement de circuits électroniques–Mise en place d'une méthode de test des systèmes T Dubois Université Montpellier II-Sciences et Techniques du Languedoc, 2009 | 11 | 2009 |
| EMC susceptibility characterization of an operational amplifier-based circuit combining different technique M Girard, T Dubois, G Duchamp, P Hoffmann 2016 International Symposium on Electromagnetic Compatibility-EMC EUROPE …, 2016 | 10 | 2016 |
| Multiport ICIM-CI modeling approach applied to a bandgap voltage reference SH Airieau, T Dubois, G Duchamp, A Durier 2016 International Symposium on Electromagnetic Compatibility-EMC EUROPE …, 2016 | 9 | 2016 |
| Modeling of a current injection system for susceptibility study G Mejecaze, L Curos, T Dubois, JM Vinassa, F Puybaret IEEE Transactions on Electromagnetic Compatibility 62 (6), 2737-2746, 2020 | 8 | 2020 |
| Surface equivalent modeling of layered composite material A Kader, M Klingler, T Dubois, G Duchamp, G Ruffié, F Bonnaudin 2013 International Symposium on Electromagnetic Compatibility, 573-578, 2013 | 8 | 2013 |
| To improve the variability of one complex system with the MKME M Breant, O Maurice, G Duchamp, T Dubois International Symposium on Electromagnetic Compatibility-EMC EUROPE, 1-6, 2012 | 8 | 2012 |
| Methodology to test automotive electrical components to wideband pulse interferences T Picon, T Dubois, M Klingler, G Duchamp IEEE Transactions on Electromagnetic Compatibility 62 (5), 1651-1660, 2020 | 7 | 2020 |
| Electromagnetic susceptibility studies of Op. Amps. and a VCO for a PLL application T Dubois, S Jarrix, J Raoult, A Pénarier, P Nouvel, D Gasquet, B Azais EMC Compo 2009, xx-xx, 2009 | 7 | 2009 |
| Effects of ageing on the conducted immunity of a voltage reference: Experimental study and modelling approach S Hairoud-Airieau, G Duchamp, T Dubois, JY Delétage, A Durier, ... Microelectronics Reliability 76, 674-679, 2017 | 6 | 2017 |
| Failure mechanism study and immunity modeling of an embedded analog-to-digital converter based on immunity measurements A Ayed, T Dubois, JL Levant, G Duchamp Microelectronics Reliability 55 (9-10), 2067-2071, 2015 | 6 | 2015 |
| A new method for the characterization of electronic components immunity A Ayed, T Dubois, JL Levant, G Duchamp IEEE Transactions on Instrumentation and Measurement 64 (9), 2496-2503, 2015 | 6 | 2015 |