Michelangelo Grosso

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Matteo SONZA REORDAPolitecnico di Torino, Dept. of Control and Computer EngineeringEmail verificata su polito.it
paolo bernardiPolitecnico di TorinoEmail verificata su polito.it
Ernesto SanchezAssociate Professor at Politecnico di TorinoEmail verificata su polito.it
Maurizio RebaudengoPolitecnico di TorinoEmail verificata su polito.it
Massimo PoncinoProfessor, Computing EngineeringEmail verificata su polito.it
Andrea AcquavivaFull Professor, Department of Electrical, Electronic and Information Engineering "Guglielmo Marconi"Email verificata su unibo.it
Edoardo PattiDept. of Control and Computer Engineering, Politecnico di TorinoEmail verificata su polito.it
Luis EntrenaUniversidad Carlos IIIEmail verificata su ing.uc3m.es
MARTA PORTELA GARCIAUniversidad Carlos III de MadridEmail verificata su ing.uc3m.es
Alessandro SassoneDepartment of Computer and Control Engineering, Politecnico di TorinoEmail verificata su polito.it
Riccardo CantoroDepartment of Control and Computer Engineering, Politecnico di TorinoEmail verificata su polito.it
Danilo DemarchiFull Professor, Politecnico di TorinoEmail verificata su polito.it
Paolo RechTrento UniversityEmail verificata su unitn.it
ALESSANDRO PACCAGNELLADipartimento di Ingegneria dell'Informazione, Università di PadovaEmail verificata su dei.unipd.it
Jaime Velasco MedinaUniversidad del ValleEmail verificata su correounivalle.edu.co
Marco CrepaldiIstituto Italiano di TecnologiaEmail verificata su iit.it
Maria K MichaelElectrical and Computer Engineering Department, KIOS Center of Excellence, University of CyprusEmail verificata su ucy.ac.cy
Wilson Javier Perez HolguinUniversidad Pedagógica y Tecnológica de ColombiaEmail verificata su uptc.edu.co
Lorenzo BottaccioliInteruniversity Department of Regional and Urban Studies and Planning - Politecnico di TorinoEmail verificata su polito.it
Alberto MaciiPolitecnico di TorinoEmail verificata su polito.it

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Michelangelo Grosso

STMicroelectronics s.r.l.

Email verificata su st.com

embedded systems test dependability


Titolo Ordina per citazioni Ordina per anno Ordina per titolo	Citata da Citata da	Anno
System-in-package testing: problems and solutions D Appello, P Bernardi, M Grosso, MS Reorda IEEE Design & Test of Computers 23 (3), 203-211, 2006	59	2006
The energy efficiency management at urban scale by means of integrated modelling A Ronzino, A Osello, E Patti, L Bottaccioli, C Danna, A Lingua, ... Energy Procedia 83, 258-268, 2015	38	2015
Fault grading of software-based self-test procedures for dependable automotive applications P Bernardi, M Grosso, E Sánchez, O Ballan 2011 Design, Automation & Test in Europe, 1-2, 2011	37	2011
On the use of embedded debug features for permanent and transient fault resilience in microprocessors M Portela-García, M Grosso, M Gallardo-Campos, MS Reorda, L Entrena, ... Microprocessors and Microsystems 36 (5), 334-343, 2012	34	2012
A programmable BIST for DRAM testing and diagnosis P Bernardi, M Grosso, MS Reorda, Y Zhang 2010 IEEE International Test Conference, 1-10, 2010	32	2010
On-line software-based self-test of the address calculation unit in RISC processors P Bernardi, L Ciganda, M de Carvalho, M Grosso, J Lagos-Benites, ... 2012 17th IEEE European Test Symposium (ETS), 1-6, 2012	31	2012
A novel sbst generation technique for path-delay faults in microprocessors exploiting gate-and rt-level descriptions K Christou, MK Michael, P Bernardi, M Grosso, E Sánchez, MS Reorda 26th IEEE VLSI Test Symposium (vts 2008), 389-394, 2008	31	2008
An on-line fault detection technique based on embedded debug features M Grosso, MS Reorda, M Portela-Garcia, M García-Valderas, ... 2010 IEEE 16th International On-Line Testing Symposium, 167-172, 2010	30	2010
A pattern ordering algorithm for reducing the size of fault dictionaries P Bernardi, M Grosso, M Rebaudengo, MS Reorda 24th IEEE VLSI Test Symposium, 6 pp.-391, 2006	29	2006
Embedded memory diagnosis: An industrial workflow D Appello, V Tancorre, P Bernardi, M Grosso, M Rebaudengo, ... 2006 IEEE International Test Conference, 1-9, 2006	28	2006
Integrating BIST techniques for on-line SoC testing A Manzone, P Bernardi, M Grosso, M Rebaudengo, E Sánchez, ... 11th IEEE International On-Line Testing Symposium, 235-240, 2005	28	2005
Smart electronic systems: an overview A Sassone, M Grosso, M Poncino, E Macii Smart Systems Integration and Simulation, 5-21, 2016	26	2016
A top-down constraint-driven methodology for smart system design M Crepaldi, M Grosso, A Sassone, S Gallinaro, S Rinaudo, M Poncino, ... IEEE Circuits and Systems Magazine 14 (1), 37-57, 2014	26	2014
Energy-efficient battery charging in electric vehicles with solar panels M Grosso, D Lena, A Bocca, A Macii, S Rinaudo 2016 IEEE 2nd International Forum on Research and Technologies for Society …, 2016	24	2016
On the automation of the test flow of complex SoCs D Appello, V Tancorre, P Bernardi, M Grosso, M Rebaudengo, ... 24th IEEE VLSI Test Symposium, 6 pp.-171, 2006	23	2006
On the functional test of the register forwarding and pipeline interlocking unit in pipelined processors P Bernardi, R Cantoro, L Ciganda, B Du, E Sánchez, MS Reorda, ... 2013 14th International Workshop on Microprocessor Test and Verification, 52-57, 2013	22	2013
A hybrid approach for detection and correction of transient faults in SoCs P Bernardi, LB Poehls, M Grosso, MS Reorda IEEE Transactions on Dependable and Secure Computing 7 (4), 439-445, 2010	21	2010
On the automatic generation of test programs for path-delay faults in microprocessor cores P Bernardi, M Grosso, E Sánchez, MS Reorda 12th IEEE European Test Symposium (ETS'07), 179-184, 2007	18	2007
An investigation on pervasive technologies for IoT-based thermal monitoring E Giusto, F Gandino, ML Greco, M Grosso, B Montrucchio, S Rinaudo Sensors 19 (3), 663, 2019	15	2019
Exploiting fault model correlations to accelerate SEU sensitivity assessment M Grosso, H Guzman-Miranda, MA Aguirre IEEE Transactions on Industrial Informatics 9 (1), 142-148, 2012	15	2012

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