| USER-SMILE: Ultrafast stimulus error removal and segmented model identification of linearity errors for ADC built-in self-test T Chen, X Jin, RL Geiger, D Chen IEEE Transactions on Circuits and Systems I: Regular Papers 65 (7), 2059-2069, 2017 | 42 | 2017 |
| A low-cost on-chip built-in self-test solution for ADC linearity test T Chen, C Park, H Meng, D Zhou, J Silva-Martinez, RL Geiger, D Chen IEEE Transactions on Instrumentation and Measurement 69 (6), 3516-3526, 2019 | 27 | 2019 |
| Ultrafast stimulus error removal algorithm for ADC linearity test T Chen, D Chen 2015 IEEE 33rd VLSI Test Symposium (VTS), 1-5, 2015 | 25 | 2015 |
| High-purity sine wave generation using nonlinear DAC with predistortion based on low-cost accurate DAC–ADC co-testing Y Zhuang, B Magstadt, T Chen, D Chen IEEE Transactions on Instrumentation and Measurement 67 (2), 279-287, 2017 | 23 | 2017 |
| An on-chip ADC BIST solution and the BIST enabled calibration scheme X Jin, T Chen, M Jain, AK Barman, D Kramer, D Garrity, R Geiger, D Chen 2017 IEEE International Test Conference (ITC), 1-10, 2017 | 16 | 2017 |
| Low-cost dithering generator for accurate ADC linearity test Y Duan, T Chen, D Chen 2016 IEEE International Symposium on Circuits and Systems (ISCAS), 1474-1477, 2016 | 15 | 2016 |
| Low-cost and accurate DAC linearity test with ultrafast segmented model identification of linearity errors and removal of measurement errors (uSMILE-ROME) SK Chaganti, T Chen, Y Zhuang, D Chen 2018 IEEE International Instrumentation and Measurement Technology …, 2018 | 14 | 2018 |
| Effect of flicker noise on SEIR for accurate ADC linearity testing Y Zhuang, T Chen, S Chaganti, D Chen 2015 IEEE 58th International Midwest Symposium on Circuits and Systems …, 2015 | 12 | 2015 |
| A 5nm 3.4 GHz tri-gear ARMv9 CPU subsystem in a fully integrated 5G flagship mobile SoC A Nayak, HC Chen, H Mair, R Lagerquist, T Chen, A Rajagopalan, ... 2022 IEEE International Solid-State Circuits Conference (ISSCC) 65, 50-52, 2022 | 7 | 2022 |
| A 12-bit 125-MS/s 2.5-bit/cycle SAR-based pipeline ADC employing a self-biased gain boosting amplifier C Park, T Chen, K Noh, D Zhou, S Prakash, MN Alizadeh, AI Karsilayan, ... IEEE Transactions on Circuits and Systems I: Regular Papers 67 (11), 3618-3629, 2020 | 7 | 2020 |
| Dynamic comparator T Chen, X Jin, JP Schat US Patent 10,505,519, 2019 | 7 | 2019 |
| An ultrafast multibit/stage pipelined ADC testing and calibration method T Chen, C Park, SK Chaganti, J Silva-Martinez, RL Geiger, D Chen IEEE Transactions on Instrumentation and Measurement 69 (3), 729-738, 2019 | 7 | 2019 |
| High-constancy offset generator robust to cdac nonlinearity for SEIR-based ADC BIST Y Duan, T Chen, Z Liu, X Zhang, D Chen 2015 IEEE International Symposium on Circuits and Systems (ISCAS), 3016-3019, 2015 | 7 | 2015 |
| 4.1 A 7nm 5G Mobile SoC Featuring a 3.0 GHz Tri-Gear Application Processor Subsystem H Chen, R Lagerquist, A Nayak, H Mair, G Manoharan, E Wang, ... 2021 IEEE International Solid-State Circuits Conference (ISSCC) 64, 54-56, 2021 | 6 | 2021 |
| Accurate linearity testing with impure sinusoidal stimulus robust against flicker noise Y Zhuang, T Chen, S Chaganti, D Chen 2016 IEEE 34th VLSI Test Symposium (VTS), 1-6, 2016 | 4 | 2016 |
| Built-in self-test and self-calibration for analog and mixed signal circuits T Chen, D Chen 2019 IEEE International Test Conference (ITC), 1-8, 2019 | 3 | 2019 |
| A low-cost dithering method for improving ADC linearity test applied in uSMILE algorithm Y Duan, T Chen, D Chen Journal of Electronic Testing 33, 709-720, 2017 | 3 | 2017 |
| Method for testing analog-to-digital converter and system therefor T Chen, X Jin US Patent 9,473,164, 2016 | 3 | 2016 |
| Method for testing differential analog-to-digital converter and system therefor T Chen, DA Garrity, X Jin US Patent 9,438,262, 2016 | 3 | 2016 |
| Apparatuses involving calibration of input offset voltage and signal delay of circuits and methods thereof T Chen, X Jin, JP Schat US Patent 11,585,849, 2023 | 2 | 2023 |
Xiankun "Robert" JinNXP SemiconductorsEmail verificata su utexas.edu