Segui
Koji Sakui
Koji Sakui
Honda Research Institute Japan
Email verificata su honda-ri.jp
Titolo
Citata da
Citata da
Anno
A CMOS bandgap reference circuit with sub-1-V operation
H Banba, H Shiga, A Umezawa, T Miyaba, T Tanzawa, S Atsumi, K Sakui
IEEE Journal of Solid-State Circuits 34 (5), 670-674, 1999
13261999
Non-volatile semiconductor memory device
Y Itoh, K Sakui
US Patent 6,107,658, 2000
1632000
A quick intelligent page-programming architecture and a shielded bitline sensing method for 3 V-only NAND flash memory
T Tanaka, Y Tanaka, H Nakamura, K Sakui, H Oodaira, R Shirota, ...
IEEE Journal of Solid-State Circuits 29 (11), 1366-1373, 1994
1621994
Semiconductor memory having transistors connected in series
K Sakui, M Noguchi
US Patent 6,411,548, 2002
1552002
A new static memory cell based on reverse base current (RBC) effect of bipolar transistor
K Sakui, T Hasegawa, T Fuse, S Watanabe, K Ohuchi, F Masuoka
Technical Digest., International Electron Devices Meeting, 44-47, 1988
1441988
A new static memory cell based on the reverse base current effect of bipolar transistors
K Sakui, T Hasegawa, T Fuse, S Watanabe, K Ohuchi, F Masuoka
IEEE transactions on electron devices 36 (6), 1215-1217, 1989
1391989
Nonvolatile semiconductor memory, fabrication method for the same, semiconductor integrated circuits and systems
M Ichige, K Hashimoto, T Kuji, S Mori, R Shirota, Y Takeuchi, K Sakui
US Patent 6,845,042, 2005
1382005
Multichip semiconductor device and memory card
K Sakui, J Miyamoto, N Hayasaka, K Okumura
US Patent 6,239,495, 2001
1302001
Non-volatile semiconductor memory device
Y Itoh, K Sakui
US Patent 6,011,287, 2000
1282000
Non-volatile semiconductor memory device
K Sakui, H Nakamura
US Patent 6,295,227, 2001
1252001
Nonvolatile memory with active and passive wear leveling
K Sakui, K Suzuki, D Yoshioka, K Kamimura, T Ishimoto, J Sumino
US Patent 7,694,066, 2010
1202010
A new technique for measuring threshold voltage distribution in flash EEPROM devices
T Himeno, N Matsukawa, H Hazama, K Sakui, M Oshikiri, K Masuda, ...
Proceedings International Conference on Microelectronic Test Structures, 283-287, 1995
1091995
A reliable bi-polarity write/erase technology in flash EEPROMs
S Aritome, R Shirota, R Kirisawa, T Endoh, R Nakayama, K Sakui, ...
International Technical Digest on Electron Devices, 111-114, 1990
1081990
Nonvolatile semiconductor memory
K Sakui, J Miyamoto
US Patent 6,307,807, 2001
1072001
Nonvolatile semiconductor memory device whose addresses are selected in a multiple access
K Sakui, K Tokushige, K Imamiya
US Patent 6,097,666, 2000
1022000
Stacked type semiconductor device
M Matsuo, N Hayasaka, T Arikado, H Ishiuchi, K Sakui, C Takubo
US Patent 6,717,251, 2004
1012004
A 120-mm/sup 2/64-Mb NAND flash memory achieving 180 ns/Byte effective program speed
JK Kim, K Sakui, SS Lee, Y Itoh, SC Kwon, K Kanazawa, KJ Lee, ...
IEEE Journal of Solid-State Circuits 32 (5), 670-680, 1997
981997
A 2.3 mu m/sup 2/memory cell structure for 16 Mb NAND EEPROMs
R Shirota, R Nakayama, R Kirisawa, M Momodomi, K Sakui, Y Itoh, ...
International Technical Digest on Electron Devices, 103-106, 1990
911990
Nonvolatile semiconductor memory device
K Takeuchi, K Sakui, T Tanaka, S Aritome
US Patent 6,046,940, 2000
872000
Semiconductor memory device
K Sakui, Y Itoh, Y Iwata
US Patent 6,049,494, 2000
832000
Il sistema al momento non può eseguire l'operazione. Riprova più tardi.
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