| Quantitative analysis of backscattered electron (BSE) contrast using low voltage scanning electron microscopy (LVSEM) and its application to Al0. 22Ga0. 78N/GaN layers AG Cid, R Rosenkranz, M Löffler, A Clausner, Y Standke, E Zschech Ultramicroscopy 195, 47-52, 2018 | 14 | 2018 |
| Optimization of the SEM working conditions: EsB detector at low voltage A Garitagoitia Cid, R Rosenkranz, E Zschech Advanced Engineering Materials 18 (2), 185-193, 2016 | 12 | 2016 |
| Energy-filtered backscattered imaging using low-voltage scanning electron microscopy: Characterizing blends of ZnPc-C60 for organic solar cells AG Cid, M Sedighi, M Löffler, WF Dorp, E Zschech | 9 | 2016 |
| Non-Destructive Imaging of Organosilicate Glass (OSG) Thin Films at Low Voltage With the EsB Detector AG Cid, E Moayedi, R Rosenkranz, A Clausner, K Pakbaz, E Zschech IEEE Transactions on Device and Materials Reliability 16 (4), 461-464, 2016 | 2 | 2016 |
| Energy‐Filtered Backscattered Imaging Using Low‐Voltage Scanning Electron Microscopy: Characterizing Blends of ZnPc–C60 for Organic Solar Cells A Garitagoitia Cid, M Sedighi, M Löffler, WF van Dorp, E Zschech Advanced Engineering Materials 18 (6), 913-917, 2016 | 2 | 2016 |
| Characterizing blends of Zn/Pc‐C60 for Organic Photovoltaic Cells using energy‐filtered Backscattered Electron (BSE) imaging in combination with Low Voltage Scanning Electron … A Garitagoitia Cid, M Sedighi, M Loeffler, WF van Dorp, E Zschech European Microscopy Congress 2016: Proceedings, 824-825, 2016 | | 2016 |
| La competencia sobre planificación de investigaciones en 4o de ESO: un estudio de caso/Competence in research planning in the fourth level of Spanish Secondary Education: a … IR Arteche, MMM Aznar, MAG Cid Revista complutense de educación 27 (1), 329, 2016 | | 2016 |
| La planificación de investigaciones y su evaluación en 4º de ESO MMM Aznar, IR Arteche, MAG Cid Enseñanza de las ciencias: revista de investigación y experiencias …, 2013 | | 2013 |
| Low-damage SEM Imaging of Organosilicate Glass (OSG) Thin Films in Semiconductor Industry AG Cid, M Boese, U Mühle, R Rosenkranz, E Zschech | | |
| Application of the EsB Detector in the Low Voltage Scanning Electron Microscopy (LVSEM) AG Cid, R Rosenkranz, E Zschech | | |
| Potential Of The EsB Detector In The Low Voltage Scanning Electron Microscopy (LVSEM): Application In Microelectronics AG Cid, R Rosenkranz, M Gall, E Zschech | | |