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Coautori
- Robert F. DavisCarnegie Mellon UniversityEmail verificata su andrew.cmu.edu
- Sung-Nam LeeKorea Polytechnic UniversityEmail verificata su kpu.ac.kr
- Tsvetanka ZhelevaUS Army Research LabEmail verificata su mail.mil
- Kyoungho HaSamsung ElectronicsEmail verificata su samsung.com
- Han-Youl RyuProfessor, Dept. of Physics, Inha UniversityEmail verificata su inha.ac.kr
- Joon Seop KwakKorea Institute of Energy Technology/Sunchon National UniversityEmail verificata su kentech.ac.kr
- Uiho ChoiEcole Polytechnique Fédérale de Lausanne (EPFL)Email verificata su epfl.ch
- Byeongchan SoLund UniversityEmail verificata su ftf.lth.se
- Taemyung KwakTech University of KoreaEmail verificata su tukorea.ac.kr
- Jinwan KimSamsungEmail verificata su samsung.com
- Geunho YooEmail verificata su kpu.ac.kr
- Euijoon YoonKorea Institute of Energy TechnologyEmail verificata su kentech.ac.kr
- Minho KimLinköping UniversityEmail verificata su liu.se
- Kyu-Seung LeeKorea Polytechnic University (Convergence Center for Advanced Nano Semiconductor)Email verificata su daum.net
- Seong Tae-YeonProfessor of Materials Science, Korea UniversityEmail verificata su korea.ac.kr
- Robert J. NemanichDepartment of Physics, Arizona State UniversityEmail verificata su asu.edu
- Jaehee ChoJeonbuk National University = Chonbuk National UniversityEmail verificata su jbnu.ac.kr
- Joocheol JeongTU KoreaEmail verificata su tukorea.ac.kr
- In Hwan LeeDepartment of Materials Science & Engineering, Korea UniversityEmail verificata su korea.ac.kr
- Joohyoung LeeSamsungEmail verificata su samsung.com