| The noise analysis and noise reliability indicators of optoelectron coupled devices Y Dai, J Xu Solid-State Electronics 44 (8), 1495-1500, 2000 | 36 | 2000 |
| 1/< i> f</i>, g–r and burst noise used as a screening threshold for reliability estimation of optoelectronic coupled devices J Xu, D Abbott, Y Dai Microelectronics Reliability 40 (1), 171-178, 2000 | 35 | 2000 |
| MOSFET 1/f noise model based on mobility fluctuation in linear region J Xu, MJ Deen Electronics Letters 38 (9), 429-431, 2002 | 22 | 2002 |
| A complete operational amplifier noise model: Analysis and measurement of correlation coefficient J Xu, Y Dai, D Abbott Circuits and Systems I: Fundamental Theory and Applications, IEEE …, 2000 | 20 | 2000 |
| Analog circuit fault diagnosis based on noise measurement Y Dai, J Xu Microelectronics Reliability 39 (8), 1293-1298, 1999 | 10 | 1999 |
| Discussion on Physical Models for Burst Noise in a Forward Biased P–N Junction and Their Experimental Validation Y Dai, Y Li, J Xu Microelectronics Reliability 38 (4), 671-675, 1998 | 10 | 1998 |
| The extraction of the signals from the transducers in the vehicle under the condition of strong electromagnetic interference Y Liu, J Xu, X Zhang, Y Dai Vehicle Electronics Conference, 1999.(IVEC'99) Proceedings of the IEEE …, 1999 | 9 | 1999 |
| The study of the relation between R< sub> n</sub>-G< sub> n</sub> noise model and E< sub> n</sub>-I< sub> n</sub> noise model of an amplifier J Xu, Y Dai, L Yaqen Circuits and Systems I: Fundamental Theory and Applications, IEEE …, 1998 | 7 | 1998 |
| A novel loss-of-signal detector with programmable assert threshold for intelligent limiting amplifier R Wang, ZG Wang, J Xu, ZQ Guan Analog Integrated Circuits and Signal Processing 72 (1), 187-192, 2012 | 2 | 2012 |
| A Novel MOSFET 1/f Noise Model Based on Mobility Fluctuation for Linear Region J Xu, Q ZHOU, X ZHANG Acta Electronica Sinica 30 (8), 1192-1195, 2002 | 1 | 2002 |
| Design of Low Noise Distributed Amplifier with Adjustable Gain Control in 0.15 um GaAs PHEMT Y Zhang, Z Wang, J Xu Energy Procedia 11, 1424-1429, 2011 | | 2011 |
| A Study of Differentially-tuned Varactor to Reduce Phase Noise in a 5GHz CMOS VCO's J Xu University of Waterloo, 2004 | | 2004 |
| The study on a screening threshold for reliability estimation of optoelectronic coupled devices J Xu, D Abbott, Y Dai Microelectronics journal 31 (7), 497-501, 2000 | | 2000 |
| Noise measurement of optoelectronic coupled devices for reliability screening: Is there an optimal threshold? J Xu, Y Dai, D Abbott AIP Conference Proceedings 511, 495, 2000 | | 2000 |
| Noise measurement used for reliability screening of optoelectronic coupled devices (OCDs) J Xu, D Abbott, Y Dai Asia Pacific Symposium on Microelectronics and MEMS, 224-231, 1999 | | 1999 |
| Noise measurement used for reliability screening of optoelectronic coupled devices (OCDs)[3893-19] J Xu, D Abbott, Y Dai PROCEEDINGS-SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING, 224-233, 1999 | | 1999 |
| The Perfected E~ nI~ n Noise Model and Its Relation with R~ nG~ n Noise Model J Xu, Y Dai JOURNAL-CHINA INSTITUTE OF COMMUNICATIONS 19, 80-84, 1998 | | 1998 |
| The effects of the imported spectral correlative coefficient of E< sub> n</sub>-I< sub> n</sub> noise model on low noise design of an amplifier J Xu, Y Dai Electronics, Circuits and Systems, 1998 IEEE International Conference on 1 …, 1998 | | 1998 |
| Operational Ampifiler Noise Model and Its Accurate Measurement J Xu, Y Li, Y Dai ACTA ELECTRONICA SINICA 26, 31-35, 1998 | | 1998 |
Derek AbbottProfessor of Electrical & Electronic Engineering, University of Adelaide, AustraliaEmail verificata su adelaide.edu.au
