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- Ikuhara YUniverfsity of TokyoEmail verificata su sigma.t.u-tokyo.ac.jp
- Scott David FindlayMonash UniversityEmail verificata su monash.edu
- Teruyasu MizoguchiInstitute of Industrial Science, The University of TokyoEmail verificata su iis.u-tokyo.ac.jp
- Stephen PennycookUniversity of TennesseeEmail verificata su utk.edu
- Gabriel Sánchez-SantolinoDepartment of Materials Physics, Universidad Complutense de Madrid (ORCID: 0000-0001-8036-707X)Email verificata su ucm.es
- Nathan LuggThe University of TokyoEmail verificata su sigma.t.u-tokyo.ac.jp
- James BubanUniversity of Illinois at ChicagoEmail verificata su uic.edu
- Peng GAO (高鹏)International Center for Quantum Materials, and Electron Microscopy Laboratory, Peking UniversityEmail verificata su pku.edu.cn
- Hiromichi OhtaRIES, Hokkaido UniversityEmail verificata su es.hokudai.ac.jp
- Shunsuke KobayashiNanointerface Analysis Group, Japan Fine Ceramics CenterEmail verificata su jfcc.or.jp
- Yeong-Gi SoAkita UniversityEmail verificata su gipc.akita-u.ac.jp
- Si-Young ChoiPOSTECHEmail verificata su postech.ac.kr
- Fumiyasu ObaLaboratory for Materials and Structures, Tokyo Institute of TechnologyEmail verificata su msl.titech.ac.jp
- Klaus van BenthemUniversity of California, DavisEmail verificata su ucdavis.edu
- Albina BorisevichOak Ridge National laboratoryEmail verificata su ornl.gov
- Michael J. HoffmannKarlsruhe Institute of TechnologyEmail verificata su kit.edu
- Maria VarelaUniversidad Complutense MadridEmail verificata su ucm.es
- Wai-Yim ChingUniversity of Missouri-Kansas CityEmail verificata su umkc.edu