Effectiveness of SEL hardening strategies and the latchup domino effect NA Dodds, NC Hooten, RA Reed, RD Schrimpf, JH Warner, NJH Roche, ...
IEEE Transactions on Nuclear Science 59 (6), 2642-2650, 2012
65 2012 Comparison of single event transients generated at four pulsed-laser test facilities-NRL, IMS, EADS, JPL S Buchner, N Roche, J Warner, D McMorrow, F Miller, S Morand, ...
IEEE Transactions on Nuclear Science 59 (4), 988-998, 2012
58 2012 Single-event effect performance of a commercial embedded ReRAM D Chen, H Kim, A Phan, E Wilcox, K LaBel, S Buchner, A Khachatrian, ...
IEEE Transactions on Nuclear Science 61 (6), 3088-3094, 2014
51 2014 A dosimetry methodology for two-photon absorption induced single-event effects measurements A Khachatrian, NJH Roche, D McMorrow, JH Warner, SP Buchner, ...
IEEE Transactions on Nuclear Science 61 (6), 3416-3423, 2014
42 2014 SEL-sensitive area mapping and the effects of reflection and diffraction from metal lines on laser SEE testing NA Dodds, NC Hooten, RA Reed, RD Schrimpf, JH Warner, NJH Roche, ...
IEEE Transactions on Nuclear Science 60 (4), 2550-2558, 2013
41 2013 The use of a dose-rate switching technique to characterize bipolar devices JÉÔ Boch, YG Velo, FÉÉ Saigne, NJH Roche, RD Schrimpf, JR Vaille, ...
IEEE transactions on Nuclear Science 56 (6), 3347-3353, 2009
41 2009 Experimental validation of an equivalent LET approach for correlating heavy-ion and laser-induced charge deposition JM Hales, A Khachatrian, S Buchner, NJH Roche, J Warner, ...
IEEE Transactions on Nuclear Science 65 (8), 1724-1733, 2018
40 2018 Design of radiation-hardened RF low-noise amplifiers using inverse-mode SiGe HBTs I Song, S Jung, NE Lourenco, US Raghunathan, ZE Fleetwood, ...
IEEE transactions on Nuclear Science 61 (6), 3218-3225, 2014
40 2014 The effects of low dose-rate ionizing radiation on the shapes of transients in the L> M124 operational amplifier S Buchner, D McMorrow, N Roche, L Dusseau, RL Pease
IEEE Transactions on Nuclear Science 55 (6), 3314-3320, 2008
38 2008 Using TCAD modeling to compare heavy-ion and laser-induced single event transients in SiGe HBTs ZE Fleetwood, NE Lourenco, A Ildefonso, JH Warner, MT Wachter, ...
IEEE Transactions on Nuclear Science 64 (1), 398-405, 2016
33 2016 A simplified approach for predicting pulsed-laser-induced carrier generation in semiconductor JM Hales, A Khachatrian, S Buchner, NJH Roche, J Warner, D McMorrow
IEEE Transactions on Nuclear Science 64 (3), 1006-1013, 2017
32 2017 Investigation and analysis of LM124 bipolar linear circuitry response phenomenon in pulsed X-ray environment NJH Roche, L Dusseau, JR Vaillé, J Mekki, YG Velo, S Perez, J Boch, ...
IEEE Transactions on Nuclear Science 57 (6), 3392-3399, 2010
31 2010 Review and analysis of the radiation-induced degradation observed for the input bias current of linear integrated circuits L Dusseau, M Bernard, J Boch, YG Velo, N Roche, E Lorfevre, F Bezerra, ...
IEEE Transactions on Nuclear Science 55 (6), 3174-3181, 2008
31 2008 A Comparison of Single-Event Transients in Pristine and Irradiated A Khachatrian, NJH Roche, S Buchner, AD Koehler, TJ Anderson, ...
IEEE Transactions on Nuclear Science 62 (6), 2743-2751, 2015
29 2015 Simulation of laser-based two-photon absorption induced charge carrier generation in silicon JM Hales, A Khachatrian, NJH Roche, JH Warner, SP Buchner, ...
IEEE Transactions on Nuclear Science 62 (4), 1550-1557, 2015
29 2015 Modeling and investigations on TID-ASETs synergistic effect in LM124 operational amplifier from three different manufacturers F Roig, L Dusseau, A Khachatrian, NJH Roche, A Privat, JR Vaillé, J Boch, ...
IEEE Transactions on Nuclear Science 60 (6), 4430-4438, 2013
29 2013 The impact of technology scaling on the single-event transient response of SiGe HBTs NE Lourenco, ZE Fleetwood, A Ildefonso, MT Wachter, NJH Roche, ...
IEEE Transactions on Nuclear Science 64 (1), 406-414, 2016
28 2016 Total ionizing dose effects in piezoelectric MEMS relays RM Proie, RG Polcawich, CD Cress, LM Sanchez, AD Grobicki, ...
IEEE Transactions on Nuclear Science 60 (6), 4505-4511, 2013
27 2013 Spatial mapping of pristine and irradiated AlGaN/GaN HEMTs with UV single-photon absorption single-event transient technique A Khachatrian, NJH Roche, SP Buchner, AD Koehler, JD Greenlee, ...
IEEE Transactions on Nuclear Science 63 (4), 1995-2001, 2016
26 2016 Single-event transient and total dose response of precision voltage reference circuits designed in a 90-nm SiGe BiCMOS technology AS Cardoso, PS Chakraborty, N Karaulac, DM Fleischhauer, ...
IEEE transactions on Nuclear Science 61 (6), 3210-3217, 2014
26 2014 
Dale P. McMorrowNaval Research LaboratoryEmail verificata su nrl.navy.mil
