Dynamics of solid thin-film dewetting in the silicon-on-insulator system E Bussmann, F Cheynis, F Leroy, P Müller, O Pierre-Louis
New Journal of Physics 13 (4), 043017, 2011
83 2011 Dewetting dynamics of silicon-on-insulator thin films F Cheynis, E Bussmann, F Leroy, T Passanante, P Müller
Physical Review B—Condensed Matter and Materials Physics 84 (24), 245439, 2011
73 2011 Sub-10 nm lateral spatial resolution in scanning capacitance microscopy achieved with solid platinum probes E Bussmann, CC Williams
Review of scientific instruments 75 (2), 422-425, 2004
50 2004 Single-electron tunneling force spectroscopy of an individual electronic state in a nonconducting surface E Bussmann, CC Williams
Applied physics letters 88 (26), 2006
44 2006 Atomic precision advanced manufacturing for digital electronics DR Ward, SW Schmucker, EM Anderson, E Bussmann, L Tracy, TM Lu, ...
EDFA Technical Articles 22 (1), 4-10, 2020
41 2020 Single-electron tunneling to insulator surfaces measured by frequency detection electrostatic force microscopy E Bussmann, DJ Kim, CC Williams
Applied physics letters 85 (13), 2538-2540, 2004
35 2004 All-optical lithography process for contacting nanometer precision donor devices DR Ward, MT Marshall, DM Campbell, TM Lu, JC Koepke, ...
Applied Physics Letters 111 (19), 2017
30 2017 Atomic-precision advanced manufacturing for Si quantum computing E Bussmann, RE Butera, JHG Owen, JN Randall, SM Rinaldi, ...
MRS Bulletin 46, 607-615, 2021
29 2021 Scanning capacitance microscopy registration of buried atomic-precision donor devices E Bussmann, M Rudolph, GS Subramania, S Misra, SM Carr, E Langlois, ...
Nanotechnology 26 (8), 085701, 2015
27 2015 Method for making semi-conductor nanocrystals oriented along a predefined direction L Borowik, JC Barbe, E Bussmann, F Cheynis, F LeRoy, D Mariolle, ...
US Patent 8,697,548, 2014
23 2014 Method for making semi-conductor nanocrystals L Borowik, JC Barbe, E Bussmann, F Cheynis, F Leroy, D Mariolle, ...
US Patent 8,647,957, 2014
23 2014 Stress effects on solid–state dewetting of nano–thin films F Cheynis, E Bussmann, F Leroy, T Passanante, P Müller
International journal of nanotechnology 9 (3-7), 396-411, 2012
23 2012 Thermal instability of silicon-on-insulator thin films measured by low-energy electron microscopy E Bussmann, F Cheynis, F Leroy, P Müller
IOP Conference Series: Materials Science and Engineering 12 (1), 012016, 2010
23 2010 One-Dimensional Defect-Mediated Diffusion of Si Adatoms <?format ?>on the E Bussmann, S Bockenhauer, FJ Himpsel, BS Swartzentruber
Physical Review Letters 101 (26), 266101, 2008
23 2008 Single-electron manipulation to and from a SiO2 surface by electrostatic force microscopy E Bussmann, N Zheng, CC Williams
Applied Physics Letters 86 (16), 2005
22 2005 Impact of incorporation kinetics on device fabrication with atomic precision JA Ivie, Q Campbell, JC Koepke, MI Brickson, PA Schultz, RP Muller, ...
Physical Review Applied 16 (5), 054037, 2021
19 * 2021 Fabrication and field emission properties of vertical, tapered GaN nanowires etched via phosphoric acid BA Kazanowska, KR Sapkota, P Lu, AA Talin, E Bussmann, T Ohta, ...
Nanotechnology 33 (3), 035301, 2021
18 2021 AlCl3 -Dosed Si(100)-2 × 1: Adsorbates, Chlorinated Al Chains, and Incorporated Al MS Radue, S Baek, A Farzaneh, KJ Dwyer, Q Campbell, AD Baczewski, ...
The Journal of Physical Chemistry C 125 (21), 11336-11347, 2021
18 2021 Semiconductor adiabatic qubits MS Carroll, W Witzel, NT Jacobson, A Ganti, AJ Landahl, M Lilly, ...
US Patent 9,530,873, 2016
18 2016 Catalytically enhanced thermal decomposition of chemically grown silicon oxide layers on Si (001) F Leroy, T Passanante, F Cheynis, S Curiotto, EB Bussmann, P Müller
Applied Physics Letters 108 (11), 2016
18 2016 
Shashank MisraSandia National LaboratoriesEmail verificata su sandia.gov