Molecular beam epitaxy growth of S Tixier, M Adamcyk, T Tiedje, S Francoeur, A Mascarenhas, P Wei, ...
Applied physics letters 82 (14), 2245-2247, 2003
527 2003 Band gap of S Francoeur, MJ Seong, A Mascarenhas, S Tixier, M Adamcyk, T Tiedje
Applied physics letters 82 (22), 3874-3876, 2003
508 2003 Giant Spin-Orbit Bowing in B Fluegel, S Francoeur, A Mascarenhas, S Tixier, EC Young, T Tiedje
Physical review letters 97 (6), 067205, 2006
497 2006 Surfactant enhanced growth of GaNAs and InGaNAs using bismuth S Tixier, M Adamcyk, EC Young, JH Schmid, T Tiedje
Journal of crystal growth 251 (1-4), 449-454, 2003
152 2003 Bismuth surfactant growth of the dilute nitride GaNxAs1− x EC Young, S Tixier, T Tiedje
Journal of crystal growth 279 (3-4), 316-320, 2005
106 2005 Bi isoelectronic impurities in GaAs S Francoeur, S Tixier, E Young, T Tiedje, A Mascarenhas
Physical Review B—Condensed Matter and Materials Physics 77 (8), 085209, 2008
99 2008 Band gaps of the dilute quaternary alloys GaNxAs1− x− yBiy and Ga1− yInyNxAs1− x S Tixier, SE Webster, EC Young, T Tiedje, S Francoeur, A Mascarenhas, ...
Applied Physics Letters 86 (11), 2005
94 2005 A new fabrication process for Ni–Ti shape memory thin films T Lehnert, S Tixier, P Böni, R Gotthardt
Materials Science and Engineering: A 273, 713-716, 1999
78 1999 Active cloud point controller for refining applications and related method GE Stewart, JT Donner, S Tixier, FM Haran, CP Luebke
US Patent 9,223,301, 2015
77 2015 Hardness enhancement of sputtered Ni3Al/Ni multilayers S Tixier, P Böni, H Van Swygenhoven
Thin Solid Films 342 (1-2), 188-193, 1999
43 1999 Bi-induced vibrational modes in GaAsBi MJ Seong, S Francoeur, S Yoon, A Mascarenhas, S Tixier, M Adamcyk, ...
Superlattices and Microstructures 37 (6), 394-400, 2005
37 2005 Grazing-incidence diffraction from multilayers GT Baumbach, S Tixier, U Pietsch, V Holý
Physical Review B 51 (23), 16848, 1995
35 1995 Spectroscopic sensor for measuring sheet properties S Tixier, DA Gordon, FM Haran
US Patent 7,382,456, 2008
32 2008 Ion beam characterization of GaAs1− x− yNxBiy epitaxial layers P Wei, S Tixier, M Chicoine, S Francoeur, A Mascarenhas, T Tiedje, ...
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2004
29 2004 Spectroscopy having correction for broadband distortion for analyzing multi-component samples FM Haran, R Meijer-Drees, S Tixier
US Patent 7,868,296, 2011
27 2011 Challenges in the field of large-m supermirrors P Böni, D Clemens, MS Kumar, S Tixier
Physica B: Condensed Matter 241, 1060-1067, 1997
27 1997 Stress minimisation in sputtered Ni/Ti supermirrors MS Kumar, P Böni, S Tixier, D Clemens
Physica B: Condensed Matter 241, 95-97, 1997
23 1997 Electron densities for the outer valence orbitals of pyridine: comparison of EMS measurements with near Hartree–Fock limit and density functional theory calculations S Tixier, WA Shapley, Y Zheng, DP Chong, CE Brion, Z Shi, S Wolfe
Chemical Physics 270 (2), 263-276, 2001
21 2001 Apparatus and method for controlling autotroph cultivation AM Fuxman, S Tixier, GE Stewart, FM Haran, JU Backstrom, K Gerbrandt
US Patent 8,478,444, 2013
20 2013 Use of fluorescent nanoparticles to measure individual layer thicknesses or composition in multi-layer films and to calibrate secondary measurement devices MKY Hughes, S Tixier
US Patent 7,858,953, 2010
19 2010 