Biophotovoltaics: natural pigments in dye-sensitized solar cells H Hug, M Bader, P Mair, T Glatzel
Applied Energy 115, 216-225, 2014
545 2014 Probing atomic structure and Majorana wavefunctions in mono-atomic Fe chains on superconducting Pb surface R Pawlak, M Kisiel, J Klinovaja, T Meier, S Kawai, T Glatzel, D Loss, ...
npj Quantum Information 2 (1), 1-5, 2016
374 2016 Kelvin probe force microscopy study on conjugated polymer/fullerene bulk heterojunction organic solar cells H Hoppe, T Glatzel, M Niggemann, A Hinsch, MC Lux-Steiner, ...
Nano letters 5 (2), 269-274, 2005
366 2005 Kelvin probe force microscopy S Sadewasser, T Glatzel
Springer 48, 201-204, 2012
301 2012 High-sensitivity quantitative Kelvin probe microscopy by noncontact ultra-high-vacuum atomic force microscopy C Sommerhalter, TW Matthes, T Glatzel, A Jäger-Waldau, MC Lux-Steiner
Applied Physics Letters 75 (2), 286-288, 1999
292 1999 Amplitude or frequency modulation-detection in Kelvin probe force microscopy T Glatzel, S Sadewasser, MC Lux-Steiner
Applied surface science 210 (1-2), 84-89, 2003
282 2003 Kelvin probe force microscopy of semiconductor surface defects Y Rosenwaks, R Shikler, T Glatzel, S Sadewasser
Physical Review B—Condensed Matter and Materials Physics 70 (8), 085320, 2004
249 2004 Efficiency limiting morphological factors of MDMO-PPV: PCBM plastic solar cells H Hoppe, T Glatzel, M Niggemann, W Schwinger, F Schaeffler, A Hinsch, ...
Thin solid films 511, 587-592, 2006
215 2006 High-resolution work function imaging of single grains of semiconductor surfaces S Sadewasser, T Glatzel, M Rusu, A Jäger-Waldau, MC Lux-Steiner
Applied Physics Letters 80 (16), 2979-2981, 2002
187 2002 Kelvin probe force microscopy for the nano scale characterization of chalcopyrite solar cell materials and devices S Sadewasser, T Glatzel, S Schuler, S Nishiwaki, R Kaigawa, ...
Thin Solid Films 431, 257-261, 2003
163 2003 Systematic Achievement of Improved Atomic-Scale Contrast<? format?> via Bimodal Dynamic Force Microscopy S Kawai, T Glatzel, S Koch, B Such, A Baratoff, E Meyer
Physical review letters 103 (22), 220801, 2009
150 2009 Atomic Scale Kelvin Probe Force Microscopy Studies of the Surface Potential Variations <?format ?>on the GH Enevoldsen, T Glatzel, MC Christensen, JV Lauritsen, F Besenbacher
Physical review letters 100 (23), 236104, 2008
145 2008 Characterization of nanoparticles using atomic force microscopy A Rao, M Schoenenberger, E Gnecco, T Glatzel, E Meyer, D Brändlin, ...
Journal of Physics: Conference Series 61 (1), 971, 2007
137 2007 T Glatzel, DF Marrón, T Schedel-Niedrig, S Sadewasser, MC Lux-Steiner
Applied physics letters 81 (11), 2017-2019, 2002
131 2002 Kelvin probe force microscopy in ultra high vacuum using amplitude modulation detection of the electrostatic forces C Sommerhalter, T Glatzel, TW Matthes, A Jäger-Waldau, MC Lux-Steiner
Applied surface science 157 (4), 263-268, 2000
125 2000 Analytical approach to the local contact potential difference on (001) ionic surfaces: Implications for Kelvin probe force microscopy F Bocquet, L Nony, C Loppacher, T Glatzel
Physical Review B—Condensed Matter and Materials Physics 78 (3), 035410, 2008
114 2008 Texture and electronic activity of grain boundaries in Cu(In,Ga)Se2 thin films G Hanna, T Glatzel, S Sadewasser, N Ott, HP Strunk, U Rau, JH Werner
Applied Physics A 82, 1-7, 2006
112 2006 Kelvin probe force microscopy on III–V semiconductors: the effect of surface defects on the local work function T Glatzel, S Sadewasser, R Shikler, Y Rosenwaks, MC Lux-Steiner
Materials Science and Engineering: B 102 (1-3), 138-142, 2003
109 2003 Water interaction with hydrogenated and oxidized detonation nanodiamonds—Microscopic and spectroscopic analyses S Stehlik, T Glatzel, V Pichot, R Pawlak, E Meyer, D Spitzer, B Rezek
Diamond and Related Materials 63, 97-102, 2016
105 2016 Ultrasensitive detection of lateral atomic-scale interactions on graphite (0001) via bimodal dynamic force measurements S Kawai, T Glatzel, S Koch, B Such, A Baratoff, E Meyer
Physical Review B—Condensed Matter and Materials Physics 81 (8), 085420, 2010
101 2010 