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- Kang L. WangElectrical Engineering DepartmentEmail verificata su ee.ucla.edu
- Axel HoffmannProfessor of Materials Science and Engineering, University of Illinois at Urbana-ChampaignEmail verificata su illinois.edu
- Wei ZhangUNC-CHEmail verificata su unc.edu
- M. Benjamin JungfleischDepartment of Physics and Astronomy, University of DelawareEmail verificata su udel.edu
- John PearsonArgonne National LaboratoryEmail verificata su anl.gov
- Guoqiang YuInstitute of Physics, Chinese Academy of SciencesEmail verificata su iphy.ac.cn
- Jianshi TangTsinghua University / IBM Research / UCLAEmail verificata su tsinghua.edu.cn
- Yabin FanWestern Digital/MIT/UCLAEmail verificata su wdc.com
- MURONG LANGUCLAEmail verificata su g.ucla.edu
- pramey upadhyayaPurdueEmail verificata su purdue.edu
- Xufeng KouShanghaiTech UniversityEmail verificata su shanghaitech.edu.cn
- Liang HeProfessor, Nanjing University, ChinaEmail verificata su nju.edu.cn
- Teng XuHigh Magnetic Field Laboratory, Chinese Academy of SciencesEmail verificata su hmfl.ac.cn
- Suzanne G.E. te VelthuisArgonne National LaboratoryEmail verificata su anl.gov
- Li-Te ChangElectrical Engineering, UCLAEmail verificata su g.ucla.edu
- Yan ZhouThe Chinese University of Hong Kong (shenzhen)Email verificata su cuhk.edu.cn
- Le ZhaoTU WienEmail verificata su tuwien.ac.at
- Yaroslav TserkovnyakUniversity of California, Los AngelesEmail verificata su physics.ucla.edu
- John KettersonNorthwestern UniversityEmail verificata su northwestern.edu
- Joseph SklenarWayne State UniversityEmail verificata su wayne.edu
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Jiang Wanjun
Department of Physics, Tsinghua University
Email verificata su tsinghua.edu.cn - Home page