| Trajectory overlaps and local magnification in three-dimensional atom probe F Vurpillot, A Bostel, D Blavette Applied Physics Letters 76 (21), 3127-3129, 2000 | 507 | 2000 |
| Design of a femtosecond laser assisted tomographic atom probe B Gault, F Vurpillot, A Vella, M Gilbert, A Menand, D Blavette, ... Review of Scientific Instruments 77 (4), 2006 | 397 | 2006 |
| Atom probe tomography: put theory into practice W Lefebvre-Ulrikson, F Vurpillot, X Sauvage Academic Press, 2016 | 236* | 2016 |
| Design of a delay-line position-sensitive detector with improved performance G Da Costa, F Vurpillot, A Bostel, M Bouet, B Deconihout Review of scientific instruments 76 (1), 2005 | 233 | 2005 |
| Nanostructure and properties of a Cu–Cr composite processed by severe plastic deformation X Sauvage, P Jessner, F Vurpillot, R Pippan Scripta Materialia 58 (12), 1125-1128, 2008 | 177 | 2008 |
| Composition of wide bandgap semiconductor materials and nanostructures measured by atom probe tomography and its dependence on the surface electric field L Mancini, N Amirifar, D Shinde, I Blum, M Gilbert, A Vella, F Vurpillot, ... The Journal of Physical Chemistry C 118 (41), 24136-24151, 2014 | 167 | 2014 |
| Atom probe tomography spatial reconstruction: Status and directions DJ Larson, B Gault, BP Geiser, F De Geuser, F Vurpillot Current Opinion in Solid State and Materials Science 17 (5), 236-247, 2013 | 165 | 2013 |
| Reconstructing atom probe data: A review F Vurpillot, B Gault, BP Geiser, DJ Larson Ultramicroscopy 132, 19-30, 2013 | 152 | 2013 |
| Chromatic aberrations in the field evaporation behavior of small precipitates EA Marquis, F Vurpillot Microscopy and microanalysis 14 (6), 561-570, 2008 | 150 | 2008 |
| Thermal response of a field emitter subjected to ultra-fast laser illumination F Vurpillot, J Houard, A Vella, B Deconihout Journal of Physics D: Applied Physics 42 (12), 125502, 2009 | 136 | 2009 |
| Correlated field evaporation as seen by atom probe tomography F De Geuser, B Gault, A Bostel, F Vurpillot Surface science 601 (2), 536-543, 2007 | 133 | 2007 |
| A model accounting for spatial overlaps in 3D atom-probe microscopy D Blavette, F Vurpillot, P Pareige, A Menand Ultramicroscopy 89 (1-3), 145-153, 2001 | 132 | 2001 |
| Modeling image distortions in 3DAP F Vurpillot, A Cerezo, D Blavette, DJ Larson Microscopy and microanalysis 10 (3), 384-390, 2004 | 125 | 2004 |
| Structural analyses in three‐dimensional atom probe: a Fourier transform approach F Vurpillot, G Da Costa, A Menand, D Blavette Journal of Microscopy 203 (3), 295-302, 2001 | 121 | 2001 |
| Estimation of the tip field enhancement on a field emitter under laser illumination B Gault, F Vurpillot, A Bostel, A Menand, B Deconihout Applied Physics Letters 86 (9), 2005 | 111 | 2005 |
| An improved reconstruction procedure for the correction of local magnification effects in three‐dimensional atom‐probe F De Geuser, W Lefebvre, F Danoix, F Vurpillot, B Forbord, D Blavette Surface and Interface Analysis: An International Journal devoted to the …, 2007 | 107 | 2007 |
| The spatial resolution of 3D atom probe in the investigation of single-phase materials F Vurpillot, A Bostel, E Cadel, D Blavette Ultramicroscopy 84 (3-4), 213-224, 2000 | 105 | 2000 |
| The shape of field emitters and the ion trajectories in three‐dimensional atom probes Vurpillot, Bostel, Blavette Journal of Microscopy 196 (3), 332-336, 1999 | 97 | 1999 |
| Improvement of multilayer analyses with a three‐dimensional atom probe F Vurpillot, D Larson, A Cerezo Surface and Interface Analysis: An International Journal devoted to the …, 2004 | 95 | 2004 |
| Estimation of the cooling times for a metallic tip under laser illumination F Vurpillot, B Gault, A Vella, M Bouet, B Deconihout Applied physics letters 88 (9), 2006 | 93 | 2006 |
Bernard DeconihoutProfessor of Physics, Normandie UniversityEmail verificata su univ-rouen.fr
