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Coautori
- Qiwen ZhanUniversity of Shanghai for Science and TechnologyEmail verificata su usst.edu.cn
- Paul McManamonExciting Technology LLC, University of DaytonEmail verificata su excitingtechnology.com
- Jason HeikenfeldProfessor of Electrical Engineering, Biomedical Engineering, University of CincinnatiEmail verificata su ucmail.uc.edu
- Jia YangBoston UniversityEmail verificata su bu.edu
- WEN CHENGUniversity of Dayton