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- Yonggang HuangWalter P. Murphy Professor of M.E., C.E.E. and M.S.E., Northwestern UniversityEmail verificata su northwestern.edu
- Qiao LinDepartment of Mechanical Engineering, Columbia UniversityEmail verificata su columbia.edu
- YuHao LiuUniversity of Illinois, Urbana ChampaignEmail verificata su illinois.edu
- Qian WangCarolina Distinguished Professor, University of South CarolinaEmail verificata su mailbox.sc.edu
- Cunjiang YuFounder Professor of Engineering, University of Illinois, Urbana-ChampaignEmail verificata su illinois.edu
- Kyung-In JangDaegu Gyeongbuk Institute of Science and TechnologyEmail verificata su dgist.ac.kr
- Jonathan A. FanAssistant Professor of Electrical Engineering, Stanford UniversityEmail verificata su stanford.edu
- Tae-il KimProfessor, School of Chemical Engineering, Sungkyunkwan University(SKKU), KoreaEmail verificata su skku.edu
- Sheng XuProfessor and Jacobs Faculty Scholar, UC San DiegoEmail verificata su ucsd.edu
- Michael R. BruchasUniversity of WashingtonEmail verificata su uw.edu
- Jerome S. SchultzDistinquished Professor of Biomedical EngineeringEmail verificata su central.uh.edu
- Yei Hwan JungAssistant Professor, Hanyang UniversityEmail verificata su hanyang.ac.kr
- Jordan G. McCallAssociate Professor of Anesthesiology, Washington University in St. LouisEmail verificata su wustl.edu
- Jeonghyun KimAssociate Professor, Department of Electronic Convergence Engineering, Kwangwoon UniversityEmail verificata su kw.ac.kr
- W. Hong YeoHarris Saunders Jr. Professor, Director of NSF SUSMED, WISH Center, and K-GTSEC, Georgia TechEmail verificata su gatech.edu
- Philip LeDucCarnegie Mellon UniversityEmail verificata su andrew.cmu.edu
- Sunghoon KangEmail verificata su samsung.com
- Bin WangColumbia UniversityEmail verificata su columbia.edu