Segui
Chiao-Chi Lin
Chiao-Chi Lin
Feng Chia University
Email verificata su ieee.org
Titolo
Citata da
Citata da
Anno
Accelerated weathering of polyaramid and polybenzimidazole firefighter protective clothing fabrics
R Davis, J Chin, CC Lin, S Petit
Polymer Degradation and Stability 95 (9), 1642-1654, 2010
852010
Depth profiling of degradation of multilayer photovoltaic backsheets after accelerated laboratory weathering: Cross-sectional Raman imaging
CC Lin, PJ Krommenhoek, SS Watson, X Gu
Solar Energy Materials and Solar Cells 144, 289-299, 2016
692016
Long-term stability of UHMWPE fibers
AL Forster, AM Forster, JW Chin, JS Peng, CC Lin, S Petit, KL Kang, ...
Polymer Degradation and Stability 114, 45-51, 2015
622015
Surface wrinkling of an elastic film: effect of residual surface stress
CC Lin, F Yang, S Lee
Langmuir 24 (23), 13627-13631, 2008
342008
A novel test method for quantifying cracking propensity of photovoltaic backsheets after ultraviolet exposure
CC Lin, Y Lyu, DS Jacobs, JH Kim, KT Wan, DL Hunston, X Gu
Progress in Photovoltaics: Research and Applications 27 (1), 44-54, 2019
312019
Degradation problem in silver nanowire transparent electrodes caused by ultraviolet exposure
CC Lin, DX Lin, SH Lin
Nanotechnology 31 (21), 215705, 2020
272020
Cracking and delamination behaviors of photovoltaic backsheet after accelerated laboratory weathering
CC Lin, Y Lyu, DL Hunston, JH Kim, KT Wan, DL Stanley, X Gu
Reliability of Photovoltaic Cells, Modules, Components, and Systems VIII …, 2015
252015
EPR kinetics in irradiated syndiotactic polystyrene at elevated temperatures
CC Lin, LJ Ming, CC Lee, S Lee
Polymer 49 (18), 3987-3992, 2008
182008
Residual stress analysis of electrodeposited thick CoMnP monolayers and CoMnP/Cu multilayers
YS Chen, CC Lin, TS Chin, JYJ Chang, CK Sung
Surface and Coatings Technology 434, 128169, 2022
122022
Chemical depth profiling of photovoltaic backsheets after accelerated laboratory weathering
CC Lin, PJ Krommenhoek, SS Watson, X Gu
Reliability of Photovoltaic Cells, Modules, Components, and Systems VII 9179 …, 2014
122014
Linking accelerated laboratory and outdoor exposure results for PV polymeric materials: a mechanistic study of EVA
X Gu, Y Pang, CC Lin, K Liu, T Nguyen, JW Chin
Reliability of Photovoltaic Cells, Modules, Components, and Systems VI 8825 …, 2013
122013
Correlation between mechanical and chemical degradation after outdoor and accelerated laboratory aging for multilayer photovoltaic backsheets
CC Lin, Y Lyu, LC Yu, X Gu
Reliability of Photovoltaic Cells, Modules, Components, and Systems IX 9938 …, 2016
112016
Ultrasound-assisted electroless deposition of Co-P hard magnetic films
CC Lin, CC Chuang, XH Li, TS Chin, JY Chang, CK Sung, SC Wang
Surface and Coatings Technology 388, 125577, 2020
92020
Effect of intensity and wavelength of spectral UV light on discoloration of laminated Glass/EVA/PPE PV module
X Gu, Y Lyu, LC Yu, CC Lin, D Stanley
3rd Atlas-NIST Workshop PV Mater. Durability, 2015
82015
Residual stress tuned magnetic properties of thick CoMnP/Cu multilayers
YS Chen, CC Lin, TS Chin, JYJ Chang, CK Sung
AIP Advances 12 (3), 2022
62022
Depth profiling of chemical and mechanical degradation of UV-exposed PV backsheets
X Gu, CC Lin, PJ Krommenhoek, Y Lyu, JH Kim, LC Yu, T Nguyen, ...
2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC), 0115-0120, 2016
62016
A review of the self-powered Wiegand sensor and its applications
CC Lin, YC Tseng, TS Chin
Magnetochemistry 8 (10), 128, 2022
52022
Effects of cathode rotation and substrate materials on electrodeposited CoMnP thick films
CW Wu, CC Lin, TS Chin, JY Chang, CK Sung
Materials Research Express 8 (1), 016103, 2021
52021
A novel CoCuP electrodeposited film with improved planar hard magnetic properties and film quality
CY Huang, CJ Hsiao, CC Lin, CS Lin, JYJ Chang, CK Sung, SC Wang, ...
Surface and Coatings Technology 350, 890-895, 2018
42018
Measurements of residual stresses in Al film/silicon nitride substrate microcantilever beam systems
CC Lin, W Fang, HY Lin, CH Hsueh, S Lee
Journal of Materials Research 26, 1279-1284, 2011
42011
Il sistema al momento non può eseguire l'operazione. Riprova più tardi.
Articoli 1–20